2017
DOI: 10.1063/1.4975115
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Fractal characterization and wettability of ion treated silicon surfaces

Abstract: Fractal characterization of surface morphology can be useful as a tool for tailoring the wetting properties of solid surfaces. In this work, rippled surfaces of Si (100) are grown using 200 keV Ar+ ion beam irradiation at different ion doses. Relationship between fractal and wetting properties of these surfaces are explored. The height-height correlation function extracted from atomic force microscopic images, demonstrates an increase in roughness exponent with an increase in ion doses. A steep variation in co… Show more

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Cited by 55 publications
(37 citation statements)
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“…The increase of peak width at the higher energies indicates the lower ordering of dots . Yadav et al have reported that the fractal parameters of the samples change with the changes in surface morphology of the ion irradiated silicon surface . Therefore, in the present study, it can be concluded that the changes in fractal parameters is due to the surface morphological changes in the ion irradiated surface.…”
Section: Resultssupporting
confidence: 52%
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“…The increase of peak width at the higher energies indicates the lower ordering of dots . Yadav et al have reported that the fractal parameters of the samples change with the changes in surface morphology of the ion irradiated silicon surface . Therefore, in the present study, it can be concluded that the changes in fractal parameters is due to the surface morphological changes in the ion irradiated surface.…”
Section: Resultssupporting
confidence: 52%
“…The autocorrelation function is used to characterize the correlation properties of the self‐affine fractal surface defined by A()r=1Pz()pz()p+rd2p where p is a two‐dimensional vector which symbolizes the 90° position of a point on the substrate, z(p) is the surface height at this point, and P is the area of the substrate. The autocorrelation function in one dimension is estimated from the height profiles z ( i , j )along the direction of first scan, given by A()r=italicml=1N()Nmw2j=1Ni=1Nmz()i+m,jz()i,j. …”
Section: Methodsmentioning
confidence: 99%
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