Free-Space Unknown Thru Measurement Using Planar Offset Short for Material Characterization

Abstract

Material characterization requires the proper calibration of a material measurement system. This paper describes a free-space unknown thru measurement method using three independent planar metal offset shorts for calibrating a free-space material measurement system. This method is validated by comparing the measurement results with those of the TRL (thru-reflect-line) measurement method for two glass plates of 2.780 mm and 4.775 mm thickness in W-band (75–110 GHz). This can be an affordable and effective alternative to conventional free-space material measurement methods because the precision fabrication of a planar offset short is more feasible and inexpensive than building a precise positioning system in a free-space material measurement system. One can use this measurement method up to a high-frequency range that the fabrication accuracy of a planar offset short is acceptable.

Free-Space Two-Tier One-Port Calibration Using a Planar Offset Short for Material Measurement

“…The scattering parameters of two reciprocal MUTs (glass plates of 2.780 mm and 4.775 mm thickness) are measured using a quasi-optic-based free-space material measurement system [26] calibrated by a free-space two-tier one-port method for 500 Hz IF bandwidth and 801 frequency sweep points in the W-band. The measured results are compared with those [27] of TRL calibration method.…”

Characterization of Resistance and Inductance of PIN Diode at mmWave Frequency Using 7-Layer Deep Neural Network

“…In this paper, we present a novel technique to extract the parasitic properties of the MA4AGP907 p-i-n diode in its forward bias state, specifically the R-L electrical parameters since it is commonly used for developing a 5G high band reconfigurable antenna [1], [10]. We designed a microstrip transmission line (tx-line), incorporating a DC biasing network and corresponding thru-reflect-line (TRL) calibration tx-line standards [19]. The calibration enables accurate extraction of the responses of the p-i-n diode while mitigating unwanted effects stemming from the measurement fixture.…”