Free-standing silicon-nitride zoneplates for neutral-helium microscopy

Reisinger, T.; Eder, Sabrina; Greve, Martin; Smith, Henry I.; Holst, Bodil

doi:10.1016/j.mee.2009.11.107

Cited by 35 publications

(21 citation statements)

References 5 publications

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“…Much effort has been devoted in recent years to the development of a scanning helium-atom microscope (SHeAM), [1][2][3][4] in which a focused beam of neutral He atoms is used as imaging probe. In fact, the first micrograph using helium atoms as an imaging probe has been reported recently.…”

Section: Introductionmentioning

confidence: 99%

Helium reflectivity and Debye temperature of graphene grown epitaxially on Ru(0001)

et al. 2011

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It is shown that the surface of an epitaxial graphene monolayer grown on Ru(0001) could be used as a quite efficient external mirror for He-atom microscopy, with a specular reflectivity of 20% of the incident beam. Furthermore, the system is stable up to 1150 K, and the He reflectivity remains almost unchanged after exposure to air. Additionally, the high reflectivity for H 2 molecules (11%) opens up the development of a H 2 microprobe suitable for lithography. The Debye temperature for this epitaxial graphene monolayer has been determined from a study of the temperature dependence of the He specular intensity as a function of incident parameters. A value of 1045 K has been obtained, which is much higher than the 590 K reported for graphite under similar conditions, and close to the value of 1287 K calculated for isolated graphene.

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Section: Introductionmentioning

confidence: 99%

Helium reflectivity and Debye temperature of graphene grown epitaxially on Ru(0001)

et al. 2011

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“…1. The beam transmitted through the microskimmer is focused by a FresnelSoret zone plate 192 μm in diameter with a 50-μm-diam middle stop [31] onto a translation stage (PI miCos). For the experiments presented here, a 10-μm-wide slit was mounted on the translation stage and used to scan the beam.…”

Section: Methodsmentioning

confidence: 99%

Zero-order filter for diffractive focusing of de Broglie matter waves

et al. 2017

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The manipulation of neutral atoms and molecules via their de Broglie wave properties, also referred to as de Broglie matter wave optics, is relevant for several fields ranging from fundamental quantum mechanics tests and quantum metrology to measurements of interaction potentials and new imaging techniques. However, there are several challenges. For example, for diffractive focusing elements, the zero-order beam provides a challenge because it decreases the signal contrast. Here we present the experimental realization of a zero-order filter, also referred to as an order-sorting aperture for de Broglie matter wave diffractive focusing elements. The zero-order filter makes it possible to measure even at low beam intensities. We present measurements of zero-order filtered, focused, neutral helium beams generated at source stagnation pressures between 11 and 81 bars. We show that for certain conditions the atom focusing at lower source stagnation pressures (broader velocity distributions) is better than what has previously been predicted. We present simulations with the software ray-tracing simulation package MCSTAS using a realistic helium source configuration, which gives very good agreement with our measurements.

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“…Fresnel zone plates have larger apertures but still block large portions of the incident beam. [4][5][6] Zone plate focusing has recently achieved resolution on the order of 1 µm. Standing light waves, which interact with atoms via the AC Stark effect, are amenable to a variety of shaping and tuning techniques.…”

Section: Introductionmentioning

confidence: 99%

Communication: Neutral atom imaging using a pulsed electromagnetic lens

Gardner

Anciaux

Raizen

2017

The Journal of Chemical Physics

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We report on progress towards a neutral atom imaging device that will be used for chemically sensitive surface microscopy and nanofabrication. Our novel technique for improving refractive power and correcting chromatic aberration in atom lenses is based on a fundamental paradigm shift from continuous-beam focusing to a pulsed, three-dimensional approach. Simulations of this system suggest that it will pave the way toward the long-sought goal of true atom imaging on the nanoscale. Using a prototype lens with a supersonic beam of metastable neon, we have imaged complex patterns with lower distortion and higher resolution than has been shown in any previous experiment. Comparison with simulations corroborates the underlying theory and encourages further refinement of the process. Published by AIP Publishing. [http://dx

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Free-standing silicon-nitride zoneplates for neutral-helium microscopy

Cited by 35 publications

References 5 publications

Helium reflectivity and Debye temperature of graphene grown epitaxially on Ru(0001)

Helium reflectivity and Debye temperature of graphene grown epitaxially on Ru(0001)

Zero-order filter for diffractive focusing of de Broglie matter waves

Communication: Neutral atom imaging using a pulsed electromagnetic lens

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