Frequency-Domain Probe Characterization and Compensation Using Reciprocity

Weng, Haixiao; Beetner, Daryl G.; DuBroff, R.E.

doi:10.1109/temc.2010.2059030

Cited by 15 publications

(10 citation statements)

References 12 publications

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“…The advantage of using an advanced modeling strategy was already shown in [20], where artificial neural networks were used. A key advantage of the proposed algorithm is the sequential behavior.…”

Section: Introductionmentioning

confidence: 99%

“…Difficulties include the accurate measurement of both amplitude and phase of the NF components [13], and the overall time needed to scan a complete device with sufficient resolution to capture all relevant elements in the NF pattern. Also, field probes themselves disturb the NFs and do not really measure one single field component directly [16]- [20], necessitating the use of calibration and compensation techniques.…”

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Automated Near-Field Scanning Algorithm for the EMC Analysis of Electronic Devices

Deschrijver

Vanhee

Pissoort

et al. 2012

IEEE Trans. Electromagn. Compat.

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Abstract-This paper presents an automated procedure to determine the electric or magnetic near-field profile of electronic systems and devices in a given plane. It combines sequential sampling to determine the optimal coordinates of near-field scan points at arbitrary coordinates in the scanning plane. The effectiveness of the approach is illustrated by applying it to both a simulated and a measured printed circuit board example.

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Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Automated Near-Field Scanning Algorithm for the EMC Analysis of Electronic Devices

Deschrijver

Vanhee

Pissoort

et al. 2012

IEEE Trans. Electromagn. Compat.

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show abstract

“…A single split-ring resonator with much smaller size was then placed in the middle of an electrically small rectangular loop for a microwave near-field probe [4] without requiring large size for metameterials. These designs are based on increasing/changing the near fields close to the device under test, not particularly suitable for certain electromagnetic compatibility and RF interference applications where field probes are expected to have little disturbance on the field distribution after they are introduced [5]. In the studies of nuclear magnetic resonance [6], the quality factor of a probe was enhanced and the input impedance of the probe was controlled by using superconductor.…”

Section: Introductionmentioning

confidence: 99%

A Magnetic-Field Resonant Probe With Enhanced Sensitivity for RF Interference Applications

Chuang

Song

et al. 2013

IEEE Trans. Electromagn. Compat.

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High-sensitive field probes are highly desirable for radio-frequency (RF) interference studies, where ultralow noise levels are of interest. By incorporating an LC resonant circuit in a differential-loop probe, together with a Marchand balun, a magnetic-field probe with enhanced sensitivity is developed. Its equivalent circuit model and design methodology are established. The design is validated by measurements. The measured relative sensitivity in terms of |S 21 | of the proposed probe increases by approximately 8.63 dB at the resonant frequency of 1.575 GHz compared to that of a conventional design. The advantage of the proposed probe is validated through its application in the measurement of a microstrip trace and a real-world cell phone design.Index Terms-Enhanced sensitivity, magnetic-field resonant probe, Marchand balun, receiver desensitization, RF interference.

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“…However, this is only valid if the field is homogenous across the sensitive area of the probe. An enhanced mathematical model of the scanning process is based on the plane wave theory and the reciprocity theorem [5,6,7,8]. The probe output signals can be described as a two-dimensional moving weighted average of the field distribution and a two-dimensional receiving function.…”

Section: Transfer Functionsmentioning

confidence: 99%

Reconstruction of currents from EMC near-field measurements by means of continuity equation constraints

Schmidt

Albach

2015

2015 IEEE Symposium on Electromagnetic Compatibility and Signal Integrity

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Electromagnetic compatibility (EMC) is a challenging task in electrical engineering. Near-field scanning provides an insight into the physical behavior of circuits and thus allows understanding the problems. Therefore, near-field scanning enables a well-directed optimization regarding EMC in electronic systems. However, it is a thorough task to gain valuable information from the measured probe signals. One of this valuable information is the distribution of currents in printed circuit boards. In context of EMC, even small current amplitudes are critical. So, the sensitivity of the probe is decisive and due to that there is a lower limit for the probe size. However, the fields across bigger probes are not homogenous and probe compensation is necessary. Additionally, it is advantageous to gain more information by the use of probes with multiple outputs. The usual way to reconstruct the current distribution is a two-step approach with the determination of the electromagnetic fields in an intermediate step. Here, a method for directly mapping dipole sources is analyzed in the context of probes with multiple outputs and simple microstrip devices under test. Parameter studies regarding the number and positions of the dipoles are carried out. Furthermore, the technique requires some a priori information. We propose using a discrete form of the continuity equation as a constraint. By this constraint a significant improvement is achieved.

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Frequency-Domain Probe Characterization and Compensation Using Reciprocity

Cited by 15 publications

References 12 publications

Automated Near-Field Scanning Algorithm for the EMC Analysis of Electronic Devices

Automated Near-Field Scanning Algorithm for the EMC Analysis of Electronic Devices

A Magnetic-Field Resonant Probe With Enhanced Sensitivity for RF Interference Applications

Reconstruction of currents from EMC near-field measurements by means of continuity equation constraints

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