“…Traditionally, currentvoltage (I-V) measurements, 11,13,14 light bias and voltage bias dependent external quantum efficiency measurements (EQE), [18][19][20][21][22] and electroluminescent measurements 23,24 have been the methods of choice for studying shunt resistance artifacts, 16,21,22,25,26 reverse breakdown voltage 27,28 and luminescent coupling (LC) effects 12,15,[29][30][31] in MJSCs, but recently new methods have also been presented. 32,33 The modulated photocurrent spectroscopy (MPCS) method probes the frequency dependence of the ac photogenerated current in response to modulated light excitation. This technique has recently been used to reveal how light biasing of various junctions affect the apparent quantum efficiency of each junction as a function of the excitation frequency.…”