Micro/Nanotribology and Its Applications 1997
DOI: 10.1007/978-94-011-5646-2_15
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Friction Force Spectroscopy in the Low-Load Regime with Well-Defined Tips

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Cited by 20 publications
(5 citation statements)
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“…A topographic AFM image is actually a convolution of the tip and sample geometry. Separation of the tip and sample contributions by contact imaging sharp or at least known sample features allows, in situ , some determination of the overall tip shape on a namometer to micrometer scale. Ex situ tip imaging by transmission electron microscopy has also been performed. , Some of these measurements have revealed that a majority of microfabricated cantilevers possess double tips and other unsuitable tip structures. , This convincingly proves that tip characterization is absolutely necessary for useful nanotribological measurements with AFM. Thin film coatings applied to the microfabricated levers can provide robust, smooth, and possibly conductive coatings. Further work in this direction would be useful, so as to provide a wider array of dependable tip structures and materials.…”
Section: Probe Tip Characterizationmentioning
confidence: 94%
“…A topographic AFM image is actually a convolution of the tip and sample geometry. Separation of the tip and sample contributions by contact imaging sharp or at least known sample features allows, in situ , some determination of the overall tip shape on a namometer to micrometer scale. Ex situ tip imaging by transmission electron microscopy has also been performed. , Some of these measurements have revealed that a majority of microfabricated cantilevers possess double tips and other unsuitable tip structures. , This convincingly proves that tip characterization is absolutely necessary for useful nanotribological measurements with AFM. Thin film coatings applied to the microfabricated levers can provide robust, smooth, and possibly conductive coatings. Further work in this direction would be useful, so as to provide a wider array of dependable tip structures and materials.…”
Section: Probe Tip Characterizationmentioning
confidence: 94%
“…The tips were formed by coating the tips of tungsten carbide-coated silicon cantilever probes (MikroMasch, Wilsonville, OR) with a smooth hydrogenated amorphous carbon film using electron beam induced decomposition (EBID) in a transmission electron microscope (TEM). 46,47 This process forms a dense hydrocarbon coating on the tip, but the exact composition and hybridizations of the carbon atoms are not known. Both tips were imaged at high resolution by TEM before and after the AFM experiments to measure tip shape and radius and to determine the extent to which the tip may have changed during the experiment.…”
Section: Methodsmentioning
confidence: 99%
“…After exposure, the apex radii could be determined very accurately with nanometer precision from the electron micrographs. The exact procedure for the preparation of the spherical tip apexes is described in [13].…”
Section: Methodsmentioning
confidence: 99%