2017
DOI: 10.2116/analsci.33.117
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Fringe and Noise Reductions of pMAIRS Spectra Using Principal Component Analysis

Abstract: Infrared p-polarized multiple-angle incidence resolution spectrometry (pMAIRS) is a promising analytical tool for revealing the molecular orientation quantitatively of each chemical group in a thin film even with surface roughness. The spectra are often disturbed by noise and fringe, however, due to the multiple reflections in the substrate and the film, which makes the quantitative analysis very difficult. Therefore, improvement of the signal to noise (SN) ratio of the spectra is expected. Principal component… Show more

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Cited by 10 publications
(10 citation statements)
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“…Instead, IR spectroscopy is a good candidate for the purpose as demonstrated in several papers, [86][87][88] since this technique has high sensitivity for nanometer-scale films. 89,90 In this work, IR pMAIRS is employed to discuss the aggregation structure of both PEN and PQ in a thin film.…”
Section: Resultsmentioning
confidence: 99%
“…Instead, IR spectroscopy is a good candidate for the purpose as demonstrated in several papers, [86][87][88] since this technique has high sensitivity for nanometer-scale films. 89,90 In this work, IR pMAIRS is employed to discuss the aggregation structure of both PEN and PQ in a thin film.…”
Section: Resultsmentioning
confidence: 99%
“…Fringe removal algorithms [5][6][7] have been widely used to improve the detection of small atom numbers [6]. Moreover, statistical analysis such as principle component analysis (PCA) and independent component analysis (ICA) [8][9][10][11], and advanced nonlinear machine learning algorithms [12,13] have been implemented to extract spatial or temporal information for a given data set. For example, the quantum phase transition [12] or the collective excitations [9] were precisely investigated with those methods.…”
Section: Introductionmentioning
confidence: 99%
“…Recently, IR p-polarized multiple-angle incidence resolution spectrometry (pMAIRS) has been successfully applied to several kinds of thin-film samples, including self-assembled monolayers, Langmuir–Blodgett films, and spin-coated films. The most prominent feature of IR pMAIRS is the simultaneous acquirement of in-plane (IP) and out-of-plane (OP) IR spectra from a thin-film sample deposited on various substrates, including Si, Ge, and CaF 2 . Further, IR pMAIRS can reduce the optical fringe of the obtained spectra, which is typically a severe problem owing to multiple internal reflections of the IR beam in the film and substrate, thus improving the signal-to-noise ratio . These characteristics are very promising for the detection of tiny amounts of functional groups at the brush chain ends on a Si wafer.…”
Section: Introductionmentioning
confidence: 99%