FRITS - a microprocessor functional BIST method

Parvathala, P.K.; Maneparambil, Kailasnath; Lindsay, W.

doi:10.1109/test.2002.1041810

Cited by 199 publications

(89 citation statements)

References 11 publications

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“…Such test operations may be used, for instance, to determine working parts of the instruction set architecture (ISA) for a given processor core. Software-implemented test operations may be instrumented using a variety of techniques: special test sequences with known inputs and outputs, self-checking tests, and quick error detection tests [34]- [41]. One area of recent work in monitors that could be employed in UnO machines are aging sensors that estimate or measure the degree of aging (for different mechanisms, such as negative bias temperature instability, NBTI, or oxide degradation for example) that a particular chip has experienced.…”

Section: B Runtime Sensing Methodsmentioning

confidence: 99%

Underdesigned and Opportunistic Computing in Presence of Hardware Variability

Gupta

Agarwal

Dolecek

et al. 2013

IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

138

116

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Abstract-Microelectronic circuits exhibit increasing variations in performance, power consumption, and reliability parameters across the manufactured parts and across use of these parts over time in the field. These variations have led to increasing use of overdesign and guardbands in design and test to ensure yield and reliability with respect to a rigid set of datasheet specifications. This paper explores the possibility of constructing computing machines that purposely expose hardware variations to various layers of the system stack including software. This leads to the vision of underdesigned hardware that utilizes a software stack that opportunistically adapts to a sensed or modeled hardware. The envisioned underdesigned and opportunistic computing (UnO) machines face a number of challenges related to the sensing infrastructure and software interfaces that can effectively utilize the sensory data. In this paper, we outline specific sensing mechanisms that we have developed and their potential use in building UnO machines.

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Section: B Runtime Sensing Methodsmentioning

confidence: 99%

Underdesigned and Opportunistic Computing in Presence of Hardware Variability

Gupta

Agarwal

Dolecek

et al. 2013

IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

138

116

View full text Add to dashboard Cite

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“…Functional test is designed to be close to the practical scenarios that can occur in the field. The conditions for each test are individually determined and set in order to mimic the particular practical scenario and not to influence the follow-up tests [42].…”

Section: Automated Diagnosis Systemmentioning

confidence: 99%

Knowledge-Driven Board-Level Functional Fault Diagnosis

Zhang

Chakrabarty

et al. 2017

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The semiconductor industry continues to relentlessly advance silicon technology scaling into the deep-submicron (DSM) era. High integration levels and structured design methods enable complex systems that can be manufactured in high volume.However, due to increasing integration densities and high operating speeds, subtle manifestation of defects leads to functional failures at the board level. Functional fault diagnosis is, therefore, necessary for board-level product qualification. However, ambiguous diagnosis results can lead to long debug times and wrong repair actions, which significantly increase repair cost and adversely impact yield.

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“…Synthetic program execution has been proposed as a method to force some errors to show up [17,22]. Synthetic programs are run on the core and their output is compared against the expected output.…”

Section: Related Workmentioning

confidence: 99%