2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits 2009
DOI: 10.1109/ipfa.2009.5232665
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Full Dynamic Laser simulation set up

Abstract: Laser Stimulation techniques are continuously developed in accordance with the apparition of new kind of defect. We propose the Full Dynamic La-ser Stimulation where the test is fully embedded in the localization process. By using a modulated laser instead of a continuous one we discriminate vectors fail in ad-dition to localization.

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Cited by 2 publications
(1 citation statement)
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“…The apparatus based on an electro-optical modulator has been recently presented [20]. Obviously, vector period has to be greater than time constants related to laser induced phenomenon: tens of microseconds for TLS, less than lOps for PLS .…”
Section: Physical Limitmentioning
confidence: 99%
“…The apparatus based on an electro-optical modulator has been recently presented [20]. Obviously, vector period has to be greater than time constants related to laser induced phenomenon: tens of microseconds for TLS, less than lOps for PLS .…”
Section: Physical Limitmentioning
confidence: 99%