“…Consequently, a malfunctioning of the product can DOI 10.18502/ken.v3i3.2053 PhIO-2018 be related to the degradation of parameters and the failure of other functional units of the module, such as ROM and microcontroller. Memory cells and microcontrollers of general purpose, in general, have relatively low radiation resistance with the level ofabsorbed dose, at which the device fails, about 5-50 krad [13,14]…”