Fundamental optical and magneto-optical constants of Co/Pt and CoNi/Pt multilayered films

Atkinson, R.; Pahirathan, S.; Salter, Ian; Grundy, P.J.; Tatnall, C.J.; Lodder, J.C.; Meng, Q.

doi:10.1016/0304-8853(96)00335-6

Cited by 26 publications

(14 citation statements)

References 13 publications

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“…13 One of the main features of magneto-optical effects is that they provide information only of a surface layer of the order of the light penetration depth in the material. For this reason, some of their best fields of application in the last decade are in the study of magnetic multilayers [14][15][16][17][18][19] and in surface magnetism. 20 In general, the magneto-optical response of a single magnetic layer is strongly dependent on the material electronic structure, light wavelength (), and on geometrical parameters such as the incidence angle or the layer thickness.…”

Section: Introductionmentioning

confidence: 99%

“…31 These theoretical analysis have enabled a large body of experimental work, in which polar and longitudinal Kerr effects are used to determine the magnetic properties of thin films and multilayers such as interlayer coupling, magnetic phases, etc. 14,15,17,18,[20][21][22][23][24][25][26][27] On the other hand, much less attention has been devoted to the study of the MOTKE in multilayers, even though it presents several advantages both from the theoretical and experimental point of view. First, the description of the light propagation in a magnetic medium in the transverse configuration is simpler than in the other configurations since only one linearly polarized plane wave is involved in any propagation direction.…”

Section: Introductionmentioning

confidence: 99%

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Magneto-optical transverse Kerr effect in multilayers

et al. 2001

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We present detailed theoretical and experimental analysis of the magneto-optic transverse Kerr effect in magnetic multilayers. The theoretical model is based upon a phenomenological permittivity tensor. From the general result, suitable only for numerical calculations, we derive several approximate analytical expressions in order to make a qualitative discussion. The theoretical predictions are compared with experimental results in Y/Co bilayers, and the good agreement found allows for an accurate determination of the magneto-optical constants of the material. Then, the theoretical model is applied to make a detailed study of interface magnetism in Y 1Ϫx Co x alloys, and to perform numerical simulations in Co/Cu and Fe/Cu multilayers. The results in multilayers highlight the complex behavior of the magneto-optic transverse Kerr effect, in which the contributions of the individual layers are never strictly additive. This nonlinearity is found to be strongly dependent on the 3d magnetic metal present and could be used to probe the alignment of the layers even in a configuration of vanishing magnetic moment.

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Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Magneto-optical transverse Kerr effect in multilayers

et al. 2001

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“…[1][2][3][4][5][6][7][8][9][10][11][12][13][14][15][16] Both Co-based and Fe-based magnetic multilayers show good blue responses which are important for higher density magneto-optical recording. [4][5][6][7][8][9][10] Large Kerr responses in the blue were believed to be related to the presence of the transition metal ͑especially Pt and Pd͒ in the interfacial region.…”

Section: Introductionmentioning

confidence: 99%

“…9,13 In previous experimental work, the dielectric tensors for magnetic multilayer structures have been measured by treating them as single layers. 9,[14][15][16] The Kerr spectra were also simulated by treating the individual layers separately within the framework of multilayer structures. 7,17,18 In the simulations in Ref.…”

Section: Introductionmentioning

confidence: 99%

Dielectric tensor for interfaces and individual layers in magnetic multilayer structures

Gao

DeVries

Thompson

et al. 2000

Journal of Applied Physics

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The magneto-optical Kerr response of metallic magnetic multilayers has been studied by determining the dielectric tensors ͑dielectric functions͒ for individual layers, including the magnetic and nonmagnetic interfacial layers. The diagonal components of these tensors were determined using in situ ellipsometric analysis, where the ellipsometric data were taken in real time during multilayer deposition. The off-diagonal components were determined by regression fitting magneto-optic polar Kerr rotation and ellipticity data to models supported by electromagnetic theory. The Voigt parameters ͑ratio between off-diagonal and diagonal components of dielectric tensors͒ were determined from these model fits. Higher magnitudes for the Voigt parameters were found at interfaces, corresponding with stronger Kerr responses observed in those materials. Five different magnetic multilayer systems were studied, including Pt/Co, Pd/Co, Au/Co, Cu/Co, and Pt/Fe multilayer structures. The Voigt parameters for the magnetic layers and magneticnonmagnetic interfaces in all five structures were determined, and in turn the dielectric tensors for the respective layers were also determined.

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“…The second experiment chosen for comparison was performed by Atkinson et al [70]. The authors fabricated several Co/Pt and CoNi/Pt multilayer films, and measurements of Kerr rotation and ellipticity were taken using a Kerr ellipsometer at wavelengths ranging from 320 to 860 nm.…”

Section: Comparison With Experimentsmentioning

confidence: 99%

Modeling the Optical Response to a Near-Field Probe Tip from a Generalized Multilayer Thin Film

Lawrence¹

2000

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The contrast mechanism in Kerr imaging is the apparent angle through which the plane of polarization is rotated upon reflection from a magnetic surface. This can be calculated for a well characterized surface given the polarization state of the incident light. As in traditional optical microscopy, the spatial resolution is limited by diffraction to roughly half the wavelength of the illumination light.The diffraction limit can be circumvented through the use of near-field scanning optical microscopy, in which the illumination source is an evanescent field at the tip of a tapered optical fiber. A novel probe design for near-field optical imaging in reflection mode will be proposed, and experimental work on the development of a near-field Kerr microscope performed up to this point will be presented.The complication in merging these two techniques arises from the complex polarization profile of the evanescent field. This profile can be characterized for a given probe geometry with the use of electromagnetic field modeling software, allowing for subsequent modeling of the polarization profile of the optical response. An algorithm for predicting the optical response to a near-field probe tip from a generalized multilayer thin-film is presented.

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Fundamental optical and magneto-optical constants of Co/Pt and CoNi/Pt multilayered films

Cited by 26 publications

References 13 publications

Magneto-optical transverse Kerr effect in multilayers

Magneto-optical transverse Kerr effect in multilayers

Dielectric tensor for interfaces and individual layers in magnetic multilayer structures

Modeling the Optical Response to a Near-Field Probe Tip from a Generalized Multilayer Thin Film

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