2016
DOI: 10.1016/j.pcrysgrow.2016.04.004
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Fundamentals and engineering of defects

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Cited by 30 publications
(15 citation statements)
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“…This decay in maximum von Mises stress is due to the decrease of the interface convexity and more accurately to the linearity of temperature field in this region. Rudolph provides more details on the relationship between thermal stress and the linearity of temperature. In order to thoroughly highlight this relationship, von Mises stress and temperature distribution along the outer surface of the crystal without and with resistive heating are presented together in Figure .…”
Section: Resultsmentioning
confidence: 99%
“…This decay in maximum von Mises stress is due to the decrease of the interface convexity and more accurately to the linearity of temperature field in this region. Rudolph provides more details on the relationship between thermal stress and the linearity of temperature. In order to thoroughly highlight this relationship, von Mises stress and temperature distribution along the outer surface of the crystal without and with resistive heating are presented together in Figure .…”
Section: Resultsmentioning
confidence: 99%
“…However, because of the high temperature in this region the stress can be mainly relaxed by plastic deformations such as sliding or multiplication of existing dislocations (the critical shear stress is low). [ 6 ] At later growth stages, the formerly newly grown crystal area moves away from the hot region. Toward lower temperatures the critical shear stress for plastic deformations strongly increases and eventually exceeds the local thermal stress.…”
Section: Introductionmentioning
confidence: 99%
“…What we do not cover by these calculations is the effect of time: the longer a crystal region remains at high temperatures, the smaller will be the remaining level of thermally induced strain and stress, which finally enters the stage of freezing. [ 6 ] A temporal analysis is also the prerequisite to perform computations including the dislocation dynamics, as, e.g., by the Alexander–Haasen model. [ 8 ]…”
Section: Introductionmentioning
confidence: 99%
“…In turn, the performance of photonic crystal devices depends strongly on their geometry, mechanical stress and defects inside (Hart et al, 2012). An interesting literature review on the important defect types, their origins as well as interactions during the bulk crystal growth from the melt and selected epitaxial processes is given in one of the recent review papers (Rudolph, 2016). Some aspects of the effect of anisotropy on defect mode features in CLCs was investigated by Gevorgyan (Gevorgyan, 2018).…”
Section: Introductionmentioning
confidence: 99%