Future directions in high-resolution electron microscopy: Novel optical components and techniques

Abstract

Electron microscopy / Microscopie électronique Future directions in high-resolution electron microscopy: Novel optical components and techniques L'avenir de la microscopie électronique à haute résolution : Éléments et techniques innovantes

Design and Manufacturing Optoelectronic Sensors for the Measurement of Refractive Index Changes under Unknown Polarization State

“…The parameter cexp is the temperature expansion coefficient of the optical fiber, and for quartz glass, its value is 0.55 × 10 −6 K −1 ; cto is the thermo-optical coefficient, equal to 8.6 × 10 −6 K −1 . ∂ Thus, after taking into account the values of the sensitivity coefficients determined experimentally, we are able to write the P-TFBG processing matrix Equation (6)…”

“…This is undoubtedly due to the dynamic advances in optical techniques [3][4][5], which include specialties such as spectroscopic and imaging techniques. Among many, the most promising seem to be high-resolution microscopy techniques [6,7], surface plasmon resonance [8][9][10], Fourier transform infrared spectroscopy [11], near-infrared spectroscopy [12], light emission caused by electronic relaxation techniques (fluorescence) [13][14][15][16], and Raman spectroscopy [17,18].…”