“…Unfortunately, in the present situation, there is a lack of suitable references (e.g., the not-yet synthesized endpoint GaBi compound 1 ), thus limiting EDS quantitative capabilities and awarding g 002 DFTEM a potential suitability for chemical quantification in this material system. Furthermore, g 002 DFTEM imaging is a very valuable technique for the investigation of compositional inhomogeneities in Ga(As,Bi) 7,8,22 since it allows the detection of small variations (around 0.5%) in the Bi content and, in particular, of composition fluctuations which cannot be detected using conventional XRD techniques. 23 Theoretical estimations of the g 002 diffracted intensity in Ga(Sb,Bi) predict, however, that the intensity contrast to GaSb is extremely low, with I 002-GaSbBi /I 002-GaSb 1.19 for Ga(Sb,Bi) with 14% Bi, which is in marked difference to Ga(As,Bi) where I 002-GaAsBi /I 002-GaAs 4.7 for Ga(As,Bi) with 14% Bi, as observed in Fig.…”