2017
DOI: 10.1088/1361-6528/aa596c
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GaAsBi/GaAs multi-quantum well LED grown by molecular beam epitaxy using a two-substrate-temperature technique

Abstract: We report a GaAsBi/GaAs multiple quantum well (MQW) light emitting diode (LED) grown by molecular beam epitaxy using a two-substrate-temperature (TST) technique. In particular, the QWs and the barriers in the intrinsic region were grown at the different temperatures of [Formula: see text] = 350 °C and [Formula: see text] respectively. Investigations of the microstructure using transmission electron microscopy (TEM) reveal homogeneous MQWs free of extended defects. Furthermore, the local determination of the Bi… Show more

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Cited by 40 publications
(29 citation statements)
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“…Substitution of As by Bi in GaAs lattice produces a much larger reduction in the band gap (60–80 meV/%Bi) than alloying by In or Sn, thus making this material attractive for infrared radiation emitters and detectors . Devices with GaAsBi active layers are already reported, including 1.23 μm wavelength GaAsBi/GaAs MQW light emitting diodes, as well as 1.142 μm wavelength GaAsBi/GaAs single quantum well lasers …”
Section: Introductionmentioning
confidence: 94%
“…Substitution of As by Bi in GaAs lattice produces a much larger reduction in the band gap (60–80 meV/%Bi) than alloying by In or Sn, thus making this material attractive for infrared radiation emitters and detectors . Devices with GaAsBi active layers are already reported, including 1.23 μm wavelength GaAsBi/GaAs MQW light emitting diodes, as well as 1.142 μm wavelength GaAsBi/GaAs single quantum well lasers …”
Section: Introductionmentioning
confidence: 94%
“…Unfortunately, in the present situation, there is a lack of suitable references (e.g., the not-yet synthesized endpoint GaBi compound 1 ), thus limiting EDS quantitative capabilities and awarding g 002 DFTEM a potential suitability for chemical quantification in this material system. Furthermore, g 002 DFTEM imaging is a very valuable technique for the investigation of compositional inhomogeneities in Ga(As,Bi) 7,8,22 since it allows the detection of small variations (around 0.5%) in the Bi content and, in particular, of composition fluctuations which cannot be detected using conventional XRD techniques. 23 Theoretical estimations of the g 002 diffracted intensity in Ga(Sb,Bi) predict, however, that the intensity contrast to GaSb is extremely low, with I 002-GaSbBi /I 002-GaSb 1.19 for Ga(Sb,Bi) with 14% Bi, which is in marked difference to Ga(As,Bi) where I 002-GaAsBi /I 002-GaAs 4.7 for Ga(As,Bi) with 14% Bi, as observed in Fig.…”
mentioning
confidence: 99%
“…Both Ga(Sb,Bi)-on-GaSb and GaSb-on-Ga(Sb,Bi) interfaces are rather symmetric and exhibit a similar interface width, which also rules out the presence of strong Bi segregation. 8,22 In general, there are no visible differences in the morphology of the QWs in the reference sample and in the laser structure (cf. Figs.…”
mentioning
confidence: 99%
“…Bismuth containing GaAs (GaAs 1- x Bi x ) is a novel and very promising material system for optoelectronic devices, especially in fiber optic communication laser diodes (LDs) operating in the (1.3–1.5) μm wavelength region due to numerous advantages [1,2]. Firstly, the incorporation of a small amount of Bi atoms into GaAs leads to a strong band gap energy reduction by (84–91) meV/%Bi [3], as well as temperature coefficient of the band gap being less sensitive to temperature [3,4].…”
Section: Introductionmentioning
confidence: 99%