2008 20th International Conference on Indium Phosphide and Related Materials 2008
DOI: 10.1109/iciprm.2008.4703012
|View full text |Cite
|
Sign up to set email alerts
|

GaAsSbN/GaAs long wavelength PIN detectors

Abstract: We report the fabrication of dilute nitride GaAsSbN/GaAs PIN detector with a cut-off wavelength over 1.5 fJm. Effect of thermal annealing on the device characteristics is also presented. We found that the thermal treatment increases the acceptor concentration of the GaAsSbN epilayer. The increment leads to the change of conduction type in undoped and Si-doped GaAsSbN and results in low quantum efficiency for the homojunction p-i-n GaAsSbN detector. A heterojunction n-GaAs/i-GaAsSbN/p-GaAsSbN detector was desig… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Publication Types

Select...

Relationship

0
0

Authors

Journals

citations
Cited by 0 publications
references
References 19 publications
0
0
0
Order By: Relevance

No citations

Set email alert for when this publication receives citations?