2000
DOI: 10.1016/s1359-6454(00)00261-5
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Gadolinia-doped ceria and yttria stabilized zirconia interfaces: regarding their application for SOFC technology

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Cited by 325 publications
(209 citation statements)
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“…This indicates that the fracture strength is very sensitive to the crack length. A scanning electron microscopy (SEM) image of gadolinia-doped ceria published by Tsoga et al 48 showed that the defect size is about 1.0 μm. Using SEM, Leng et al 49 showed that the gadoliniadoped ceria defect was about 2.0 μm.…”
Section: Resultsmentioning
confidence: 99%
“…This indicates that the fracture strength is very sensitive to the crack length. A scanning electron microscopy (SEM) image of gadolinia-doped ceria published by Tsoga et al 48 showed that the defect size is about 1.0 μm. Using SEM, Leng et al 49 showed that the gadoliniadoped ceria defect was about 2.0 μm.…”
Section: Resultsmentioning
confidence: 99%
“…5). This solid solution is an insulating layer that has a low ionic conductivity [7,10]. Nguyen et al studied a GDC interlayer between an LSCF cathode and a scandia-stabilized zirconia (ScSZ) electrolyte, which was deposited by screen-printing [17].…”
Section: Resultsmentioning
confidence: 99%
“…However, GDC has poor sintering properties; therefore, it is difficult to fabricate a thin dense layer on the YSZ. Also, (Zr, Ce)O 2 -based solid solutions can form between the YSZ electrolyte and the GDC layer at 1200℃, and have a much lower ionic conductivity than GDC and YSZ [10]. Thus, it is very important to optimize the GDC sintering temperature to obtain a dense electrolyte, minimizing the formation of a (Zr, Ce)O 2 -based solid-solution insulating-phase.…”
Section: Introductionmentioning
confidence: 99%
“…However, at these temperatures CGO and YSZ form a solid solution which has a significantly lower oxide ion conductivity compared to both of the pure compounds. [21][22][23] An alternative way to fabricate CGO barriers are by physical vapor deposition techniques such as magnetron sputtering, pulsed laser ablation, and electron beam evaporation. [16,20,24] Studies comparing deposition techniques have provided evidence that CGO barrier layers fabricated by reactive magnetron sputtering show better performance.…”
Section: Introductionmentioning
confidence: 99%