The (100) surface of gallium arsenide was examined during and after exposure to liquid methanol and 0.05N methanolic potassium hydroxide, using surface infrared spectroscopy in the multiple internal reflection mode. Liquid methanol dissolves components of the natural oxide present at the semiconductor surface (Ga2Q, 690 cm-', and a sub-oxide of gallium or arsenic, 765 cm -1) and leaves behind a persistent physisorbed layer following evaporation. The natural oxide regrows at a rate of approximately 10A per hour, while methanol is still adsorbed at the surface, indicating that the layer is non-protective. Methanolic potassium hydroxide etches the gallium arsenide surface, most likely via a two-step oxidation/ dissolution process. Methanolic KOH also leaves a layer of crystalline potassium methoxide on the surface following evaporation, as evidenced by absorption bands at 1059 cm -1 (C--O stretch) and 2812 and 2924 cm -~ (CH3 stretches).Despite trends in the electronics industry toward dry processing of wafers (e.g., dry etching, plasma stripping of resists), there are still routine processing steps in which wafers are contacted with liquid. Noteworthy among these processes are cleaning/degreasing steps in organic solvents. Organic-based solutions are also routinely employed in semiconductor research as anisotropic and crystallographic (defect delineation) etchants (1, 2). In addition, it has been demonstrated that gallium arsenide can be anodized in organic electrolytes to produce an insulating oxide surface layer (3). In this study, the gallium arsenide surface was investigated in situ under exposure to methanol and 0.05N methanolic potassium hydroxide.Efforts to understand the surface chemistry involved in wet processing have been hampered by the fact that electrons and ions have severely limited path lengths in the liquid phase. Therefore, conventional methods of surface chemical investigation such as Auger electron spectroscopy and x-ray photoelectron spectroscopy have little capability for characterizing a liquid-solid interface in situ.To study such interfaces, techniques employing photons must normally be employed. Ideally, the photons used should be low-energy so as to have a minimal effect on the chemistry occurring at the surface.Surface infrared spectroscopy (SIRS) is a low-energy photonic technique which has been implemented in numerous studies (4, 5). It has been used primarily in investigations of adsorption and reaction at metal surfaces [e.g., CO oxidation on platinum (6, 7)] but has been finding increased use as a probe of semiconductor surface chemistry, including UHV studies of hydrogen adsorption on silicon (8) and studies of Si/HF surface chemistry (9, 10).The investigations of Burrows et al. (6,7) have also shown that SIRS can be used effectively outside of UHV conditions to study the chemistry of gas-solid interfaces under conditions closely approximating those present in actual processes.The initial efforts at adapting surface infrared techniques to examine liquid-solid interfaces were made ...