2021
DOI: 10.1007/s10967-020-07565-z
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Gamma irradiation induced microstructural modification and electrical conductivity of bakelite resistive plate chamber material

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Cited by 4 publications
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“…High−energy particles make electrons leave their original positions under irradiation. New electron−hole pairs are formed which increases the leakage current [7]. At the same time, high−energy particles may also break the Si−O bond and form the Si−Si bond, resulting in irreversible damage to the oxide layer [8].…”
Section: Introductionmentioning
confidence: 99%
“…High−energy particles make electrons leave their original positions under irradiation. New electron−hole pairs are formed which increases the leakage current [7]. At the same time, high−energy particles may also break the Si−O bond and form the Si−Si bond, resulting in irreversible damage to the oxide layer [8].…”
Section: Introductionmentioning
confidence: 99%