To
improve the performance of semiconductor photoelectrodes for
water splitting, the amount of band bending in the depletion layer
of a semiconductor should be accurately ascertained, since it determines
the splitting efficiency of photogenerated carriers. Band bending
has been determined by X-ray photoelectron spectroscopy (XPS) from
the valence band maximum (VBM), which has been calculated from the
Ga 3d peak using the energy difference between VBM and Ga 3d (ΔE
VBM‑3d). This work validates several
values for ΔE
VBM‑3d which
have been reported previously, by analyzing the spectrum around the
VBM and its distance from Ga 3d for the n-GaN(0001) surface under
both ultrahigh vacuum (UHV) and ambient H2O. ΔE
VBM‑3d is estimated to be between 17.36 and 17.55
eV. By adopting 17.5 eV as ΔE
VBM‑3d, the amounts of band-bending were 0.5 eV under UHV and 0.1 eV under
a relative humidity of 46%, respectively. For the latter condition,
a surface photovoltage of 20 meV was observed upon Xe lamp irradiation,
confirming the existence of band bending even with H2O
adsorption on the surface. The origin of such band bending seems to
be Fermi level pinning to the subsurface states which cannot be compensated
by H2O.