2015
DOI: 10.1016/j.ijheatmasstransfer.2015.01.035
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Gas flow optimization during the cooling of multicrystalline silicon ingot

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Cited by 22 publications
(3 citation statements)
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“…As the maximum dislocation agglomerates density appeared in the central of ingot, brick C15 was chosen to test the dislocation agglomerates density. In the PL image of silicon wafers, the ratio of dark patterns area to the whole wafer area represents dislocation agglomerates density level [7], which could be used as evaluation criterion to track dislocation propagation trend along the growth direction. As shown in Fig.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…As the maximum dislocation agglomerates density appeared in the central of ingot, brick C15 was chosen to test the dislocation agglomerates density. In the PL image of silicon wafers, the ratio of dark patterns area to the whole wafer area represents dislocation agglomerates density level [7], which could be used as evaluation criterion to track dislocation propagation trend along the growth direction. As shown in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…Zhou et al [5,6] proposed a modified cooling process with lower temperatures of both thermocouples 1 and 2, and they found that the final dislocation density could be reduced significantly with the modified cooling process. Wang et al [7] investigated the effect of gas velocity on the thermal stress during the cooling process, and concluded that a fast gas inlet at the initial cooling changing a slow gas inlet at the later stage of cooling by a certain ramping-down rate is conducive to reduce the stress level. Some improved…”
Section: Introductionmentioning
confidence: 99%
“…Основным процессом при росте кристаллов является теплообмен, кристаллизация чистого вещества определяется только полем температуры. Есть исключения: эпитаксия в реакторах с горячей стенкой [91], рост из раствора [92], включая кристаллизацию белков [110,111].…”
Section: математические моделиunclassified