2006
DOI: 10.1016/j.vacuum.2005.11.005
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Gas pressure effects on thickness uniformity and circumvented deposition during sputter deposition process

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Cited by 26 publications
(13 citation statements)
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“…The improvement of the QCM(E)/QCM(C) ratio at greater T-S distances at 0.5 Pa was due to a geometrical eŠect involving the size of the erosion proˆle (22 mm in diameter) and the distance between the two QCMs (28 mm). The signiˆcantly smaller E/C ratio at higher gas pressures was considered to be caused by the diŠusive transport of the sputtered particles 5) . Since the thermalized particles near the target travelled a long distance to reach the QCM(E), and the ratio of the Edge/Center distances was more signiˆcant in the case of a shorter T-S distance, the E/C ratio of the deposition rate showed the worst thickness uniformity.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…The improvement of the QCM(E)/QCM(C) ratio at greater T-S distances at 0.5 Pa was due to a geometrical eŠect involving the size of the erosion proˆle (22 mm in diameter) and the distance between the two QCMs (28 mm). The signiˆcantly smaller E/C ratio at higher gas pressures was considered to be caused by the diŠusive transport of the sputtered particles 5) . Since the thermalized particles near the target travelled a long distance to reach the QCM(E), and the ratio of the Edge/Center distances was more signiˆcant in the case of a shorter T-S distance, the E/C ratio of the deposition rate showed the worst thickness uniformity.…”
Section: Resultsmentioning
confidence: 99%
“…They are signiˆcantly diŠerent with regard to the energy of atoms reaching the substrate, the arrival ‰ux (deposition rate), and their proˆles. In a previous study 5) , we experimentally measured the pressure dependence of the deposition proˆle and elucidated the eŠect of thermalization for Al, Cu, and Mo. We designed a holder consisting of 3 quartz crystal thickness monitors (QCMs) and studied the dependence of thickness proˆle on the process gas pressure atˆxed T-S distances of 4 and 6 cm.…”
Section: Introductionmentioning
confidence: 99%
“…This method involves high temperature vacuum evaporation of the material to be coated on the support. Anatase layers have been deposited in this way, showing a super-hydrophilic behavior under band-gap irradiation as reported by several researchers in the field [91]. When using chemical vapor deposition (CVD), the substrate is exposed to volatile compounds that decompose on the substrate, leading to the desired coatings [92][93][94].…”
Section: Tio 2 /Cu Synthesis Leading To Uniform Adhesive and Antibamentioning
confidence: 90%
“…Physical vapor deposition (PVD) and chemical vapor deposition (CVD) have been widely used as mentioned in references [91][92][93][94] to coat glass, silicon, polymers, and steel with TiO 2 and other metals and metal/oxides. Work along these lines, coating TiO 2 /Cu on silica by CVD at 500 • C has been reported [159].…”
Section: Photocatalytic/catalytic Bactericidal Effects On E Coli Andmentioning
confidence: 99%
“…The growth rate and the energy distribution of the sputtered atoms can be adjusted by controlling those parameters. 17 This gives the opportunity to adjust the morphology of the deposited films. For example, at high Ar pressure the sputtered atoms are thermalized and cluster growth is promoted.…”
Section: B Deposition Systemmentioning
confidence: 99%