GDOES Depth Profile Analysis of Interfacial Enrichment of Copper during Anodizing of Al-Cu Alloy

Habazaki, H.; Uemura, M.; Fushimi, Koji; Tsuji, Etsushi; Aoki, Yoshitaka; Nagata, Shinji

doi:10.4139/sfj.66.670

Cited by 2 publications

(1 citation statement)

References 14 publications

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“…./TiAlN/TiN с толщиной каждого из слоев 3 nm. Степень обогащения медью интерфейсов анодированных пленок бинарных сплавов Al−Cu в зависимости от технологических параметров процесса исследована в [14,15]. Применение GDOES для качественного и количественного анализа состава покрытий жестких магнитных дисков описано в [16,17].…”

Section: Introductionunclassified

Профильный Анализ Пленок Ферритов-Гранатов Методом Оптической Эмиссионной Спектроскопии Тлеющего Разряда

Fedorenko

Berzhanskiĭ

Karavainikov

et al. 2021

Журнал Технической Физики

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Annotation.The paper presents the results of experiments on the application of the method of optical emission spectroscopy of a glow discharge for the profile analysis of vacuum-deposited single and two-layer films of multicomponent garnet ferrites of various compositions before and after crystallization annealing. The presence of internal and external transition layers was revealed, and the modification of their elemental composition during crystallization, as well as the different sequence of synthesis of individual components in ferrite-garnet heterostructures, was investigated.

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Section: Introductionunclassified