2011
DOI: 10.1186/1556-276x-6-522
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Ge quantum dot arrays grown by ultrahigh vacuum molecular-beam epitaxy on the Si(001) surface: nucleation, morphology, and CMOS compatibility

Abstract: Issues of morphology, nucleation, and growth of Ge cluster arrays deposited by ultrahigh vacuum molecular beam epitaxy on the Si(001) surface are considered. Difference in nucleation of quantum dots during Ge deposition at low (≲600°C) and high (≳600°C) temperatures is studied by high resolution scanning tunneling microscopy. The atomic models of growth of both species of Ge huts--pyramids and wedges-- are proposed. The growth cycle of Ge QD arrays at low temperatures is explored. A problem of lowering of the … Show more

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Cited by 24 publications
(38 citation statements)
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“…There are two possible models of processes which, in principal, may describe the growth of huts. 17 The first one implies that the cluster growth goes on due to uniform attachment of Ge atoms to all cluster facets (we refer to this model as a model of uniform growth). 17 This means that the width of a cluster in all <110> directions increases by the value of two elementary translations (or in total by four elementary translations along each <110> axis) after each step of completion of the cluster facets (Fig.…”
Section: A Models Of Uniform and Non-uniform Growthmentioning
confidence: 99%
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“…There are two possible models of processes which, in principal, may describe the growth of huts. 17 The first one implies that the cluster growth goes on due to uniform attachment of Ge atoms to all cluster facets (we refer to this model as a model of uniform growth). 17 This means that the width of a cluster in all <110> directions increases by the value of two elementary translations (or in total by four elementary translations along each <110> axis) after each step of completion of the cluster facets (Fig.…”
Section: A Models Of Uniform and Non-uniform Growthmentioning
confidence: 99%
“…Experiments were carried out using a specially built setup 16,17 consisting of a UHV MBE vessel (Riber EVA 32) connected with a UHV STM chamber (GPI 300) 24 . Details of the pre-growth treatments of Si wafers, which included chemical etching and oxide removal by short high-temperature annealing (T ∼ 900℃), can be found in our previous articles cited in Refs.…”
Section: A Techniquesmentioning
confidence: 99%
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