2016
DOI: 10.1134/s0020168516120141
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General aspects of the growth of copper nitride nanofilms

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Cited by 3 publications
(5 citation statements)
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“…One condition [25,[27][28][29][30] for the ability of lead(II) oxide to hinder the interaction is the uniformity of the oxide film. According to the Pilling-Bedworth criterion (1.31 for lead), the formation of an uniform oxide film should be expected.…”
Section: Resultsmentioning
confidence: 99%
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“…One condition [25,[27][28][29][30] for the ability of lead(II) oxide to hinder the interaction is the uniformity of the oxide film. According to the Pilling-Bedworth criterion (1.31 for lead), the formation of an uniform oxide film should be expected.…”
Section: Resultsmentioning
confidence: 99%
“…The effects were recorded gravimetri cally and spectrophotometrically before and after the thermal treatment. The photo EMF (U Ph ) was mea sured in vacuum (1 × 10 -5 Pa) on a unit that included a V7 30 electrometric voltmeter or a TR 1501 elec trometer [27]. A mercury (DRT 250) and xenon (DKsSh 1000) lamps were the sources of light.…”
Section: Methodsmentioning
confidence: 99%
“…4, curve 1). The nickel(II) oxide layer formed during the preparation and heat treatment of the nickel films hinders the movement of cationic vacan cies from the NiO surface to the Ni-NiO interface and thus inhibit the reaction between nickel and oxy gen. One of the conditions [25,[27][28][29][30] characterizing the ability of nickel(II) oxide to inhibit the reaction process is the continuity of the oxide film. According to the Pilling-Bedworth ratio, which is 1.72 for nickel, it is logical to expect the formation of a contin uous oxide film.…”
Section: Nimentioning
confidence: 99%
“…The fairly high electron mobility and low velocity of cation vacancies in the Ni-NiO system result in a potential that generates an electric field at the Ni-NiO contact (the electric field strength is ∼10 6 V/cm). If the thickness of the NiO film is less than 5 nm, the electric field can pull ions from the metal and transport them through the oxide layer [25,[27][28][29][30][31]. The growth rate of the film is then determined by the rate at which ions are removed from the metal, and the experimental data are satisfactorily described in terms of inverse logarithmic laws (Fig.…”
Section: Nimentioning
confidence: 99%
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