Generating optimal design for ALT experiment with time censoring

Saleh, Moein; Pan, Rong

doi:10.1109/rams.2013.6517665

Cited by 1 publication

(1 citation statement)

References 17 publications

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“…Ma et al used a sampling method to optimized electro-migration (EM) tests [14]. As computer generated optimal experimental designs have become popular, Saleh and Pan [15] discussed a computational method to find the D-optimal ALT plans through the generalized linear model (GLM) of an accelerated life testing problem. D-optimal, time I-optimal, and probability I-optimal are the optimal guidelines for ALT plan design [15,16].…”

Section: Troductiomentioning

confidence: 99%

Employing optimal experimental design to optimize the accelerated life test plan for TDDB

Cheng

Yang

et al. 2015

2015 Annual Reliability and Maintainability Symposium (RAMS)

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Time Dependent Dielectric Breakdown (TDDB) is one of the major indices to evaluate the Gate Oxide Integrity (GOI) reliability of Integrated Circuit (IC) devices. Permutation and combination theory helps to derive the many combinations of temperature and voltage stress levels to determine TDDB parameters (i.e., and Ea) with a pre-specified sample size. In this work, a statistical tool (JMP10) with optimal experimental design platform for accelerated life test (ALT) is employed to select stressing conditions, to optimize the ALT test plan with a special distribution of sample size for each stressing condition, to model parameter estimation, and to predict lifetimes. Comparing our proposed DOE method to the most popular conventional method, we find our DOE method is better from both theoretical and experimental standpoints. Based on this study, we propose an optimized combination of stressing conditions and sample size allocation for each stress condition. Our proposed method saves capacity, shortens half of the test time, and obtains a narrower confidence interval (CI) of the estimated TDDB lifetime.

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Section: Troductiomentioning

confidence: 99%