2003
DOI: 10.1134/1.1568467
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Generation-recombination centers in CdTe:V

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Cited by 5 publications
(7 citation statements)
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“…For the straight section of the graph, the coefficient n grows from 1.0 to 1.6. An analysis of the obtained data shows that the current flow mechanism in the Ge-GeS:Nd heterojunction and the generation-recombination processes in the region of volume charges reconcile with the Sah-Noyce-Shockley theory [7]. The activation energy is calculated using the value of the slope angle of the I q f(1/T)temperature curve plotted using VAC.…”
Section: Experimental Data and Their Discussionmentioning
confidence: 75%
“…For the straight section of the graph, the coefficient n grows from 1.0 to 1.6. An analysis of the obtained data shows that the current flow mechanism in the Ge-GeS:Nd heterojunction and the generation-recombination processes in the region of volume charges reconcile with the Sah-Noyce-Shockley theory [7]. The activation energy is calculated using the value of the slope angle of the I q f(1/T)temperature curve plotted using VAC.…”
Section: Experimental Data and Their Discussionmentioning
confidence: 75%
“…The cutoffs of the straight line on the axes yield the surface-recombination velocity S n = (33.5)×10 7 cm/s, the electron diffusion length L n = 1.31.7 µm, and the electron lifetime τ n = (0.71.2)×10 9 s (D n = 25 cm 2 /s at 300 K). Such a small value of τ n is attributable to the presence of deep levels in the bandgap due to heavy V doping, which is also proved by the results of studying the surface-barrier structures on a similar material [19].…”
Section: Lifetime and Surface Recombination Velocitymentioning
confidence: 73%
“…Letting α approach ∞, we obtain the value of ∆n in the saturation region (19) and dividing ∆n(∞) by ∆n(α)∆n(∞), we obtain the value that is linearly dependent on α:…”
Section: Lifetime and Surface Recombination Velocitymentioning
confidence: 99%
“…Из рисунка 2, а видно, результаты расчётов очень хорошо согласуются с экспериментальными данными при V0-0,8 В. При этом прямой ток следует зависимости Iexp(qV/nkT) в пределах 4 порядков при n1,9. Отличие в значении n от 2 объясняется тем, что, согласно теории, зависимость тока рекомбинации от напряжения определяется как показателем exp(qV/2kT), так и предэкспоненциальным множителем (E g 2qV) -1/2 , что несколько ускоряет увеличение тока с напряжением и, тем самым, уменьшает фактор идеальности [12]. Теория также даёт точное описание зависимости J(V) при V0,5 эВ, если принять  0 0,76 эВ (рис.…”
Section: структуры для исследованийunclassified
“…3 кружками, а результаты расчёта -сплошной линией. Расчёт выполнен на основе теоретической модели, используемой для солнечных элементов CdS/CdTe [15].…”
Section: спектры квантовой эффективностиunclassified