Laser Pulses - Theory, Technology, and Applications 2012
DOI: 10.5772/53481
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GeO2 Films with Ge-Nanoclusters in Layered Compositions: Structural Modifications with Laser Pulses

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Cited by 7 publications
(3 citation statements)
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“…The GeÀGe peak is also broad and centred at ñ = 280 cm À1 , which corresponds well with the formation of an amorphous phase. [28] The SiÀGe peak at ñ % 410 cm À1 is more or less consistent with that reported in the literature (for Si 0.5 Ge 0.5 , the SiÀGe peak occurred at ñ = 407 cm…”
Section: Resultssupporting
confidence: 78%
“…The GeÀGe peak is also broad and centred at ñ = 280 cm À1 , which corresponds well with the formation of an amorphous phase. [28] The SiÀGe peak at ñ % 410 cm À1 is more or less consistent with that reported in the literature (for Si 0.5 Ge 0.5 , the SiÀGe peak occurred at ñ = 407 cm…”
Section: Resultssupporting
confidence: 78%
“…As for FTIR results, only chemical bonding of GeS is found before the SCF treatment. However, more intensive peaks of GeO bonding are obtained at 470 and 610 cm −1 wavenumbers, respectively . The FTIR result indicates that the original GeS film attains GeO properties through the water‐supplemented scCO 2 SCF oxidation treatment.…”
mentioning
confidence: 92%
“…This implies the production of ncGe originates mainly from the thermally induced disproportionation and crystallization reaction that occurs at higher temperatures [Eq. ( 3)]: [19] 2 GeO…”
mentioning
confidence: 99%