version of the following article: Rasmussen, Morten K. ; Foster, Adam S. ; Canova, Filippo F. ; Hinnemann, Berit ; Helveg, Stig ; Meinander, Kristoffer ; Besenbacher, Flemming ; Lauritsen, Jeppe V.. 2011. Noncontact atomic force microscopy imaging of atomic structure and cation defects of the polar MgAl2O4 (100) All material supplied via Aaltodoc is protected by copyright and other intellectual property rights, and duplication or sale of all or part of any of the repository collections is not permitted, except that material may be duplicated by you for your research use or educational purposes in electronic or print form. You must obtain permission for any other use. Electronic or print copies may not be offered, whether for sale or otherwise to anyone who is not an authorised user. Atom-resolved noncontact atomic force microscopy (NC-AFM) was recently used to reveal that the insulating spinel MgAl 2 O 4 (100) surface, when prepared under vacuum conditions, adopts a structurally well-defined Al and O-rich structure (Al 4 -O 4 -Al 4 termination) consisting of alternating Al and double-O rows, which are, however, interrupted by defects identified as interchanged Mg in the surface layers (so-called antisite defects). From an interplay of futher NC-AFM experiments and first-principles NC-AFM image simulations, we present here a detailed analysis of the NC-AFM contrast on the MgAl 2 O 4 (100) surface. Experiments show that the contrast on MgAl 2 O 4 (100) in atom-resolved NC-AFM is dominated by two distinctly different types of contrast modes, reflecting two oppositely charged tip-apex terminations. In this paper, we analyze the contrast associated with these imaging modes and show that a positively charged tip-apex (presumably Mg 2+ ) interacts most strongly with the oxygen atoms, thus imaging the oxygen lattice, whereas a negatively charged tip-apex (O 2− ) will reveal the cation sublattice on MgAl 2 O 4 . The analysis of force-vs-distance calculations for the two tips shows that this qualitative picture, developed in our previous study, holds for all realistic tip-surface imaging parameters, but the detailed resolution on the O double rows and Al rows changes as a function of tip-surface distance, which is also observed experimentally. We also provide an analysis of the tip dependency and tip-surface distance dependency for the NC-AFM contrast associated with single Al vacancies and Mg-Al antisite defects on the MgAl 2 O 4 (100) surface and show that it is possible on the basis of NC-AFM image simulations to discriminate between the Al 3+ and Mg 2+ species in antisite defects and hypothetical Al vacancies.