1968
DOI: 10.1002/macp.1968.021180115
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Gitterstörungen in polyäthylen

Abstract: ZUSAMMENFASSUNG:Es wird gezeigt, wie aus Messungen der Winkelabhangigkeit der Linienbreite in Rontgenweitwinkeldiagrammen von Hochpolymeren die KristallitgroDe und die Gitterstorungen bestimmt werden konnen. I n losungskristallisierten linearen Polyathylenen treten rein parakristalline Gitterstorungen auf, die thermodynamisch stabil sind. Verzweigtes Polyathylen zeigt mit dem Verzweigungsgrad anwachsende Gitterstorungen und abnehmende KristallitgroDen. I m schmelzkristallisierten linearen Polyathylen werden Sp… Show more

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Cited by 129 publications
(55 citation statements)
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“…Rao et al 43 The paracrystalline lattice structure analysis developed by Barton 116 is founded by Hosemann [117][118][119][120][121] . The defects in the crystal lattice can be improved by the possibility of lateral crystal growth (Axial crystal size) particularly along the hydrogen bonding direction occurring during the heat treatment of the PPTA fiber.…”
Section: Axial Crystal Size (L)mentioning
confidence: 99%
“…Rao et al 43 The paracrystalline lattice structure analysis developed by Barton 116 is founded by Hosemann [117][118][119][120][121] . The defects in the crystal lattice can be improved by the possibility of lateral crystal growth (Axial crystal size) particularly along the hydrogen bonding direction occurring during the heat treatment of the PPTA fiber.…”
Section: Axial Crystal Size (L)mentioning
confidence: 99%
“…The experimental procedure is described in detail in ref 2. According to the integral breadth (IB) method 4 based on the paracrystalline theory the IB of the 00 I reflection of the Cauthy type is given by (1) where Dw denotes the 'weight-average' crystallite size along the chain axis, c the averaged cdimension, g the longitudinal distortion parameter, and s 1 =2 sin BJ.1 .. Among the 001 reflections of PTEOX only two reflections 009 and 0018 can be used, since the 0027 reflection is too weak.…”
Section: Methodsmentioning
confidence: 99%
“…A symmetrical-reflection technique was employed to record the diffraction intensity curves, which were detected by a scintillation counter with a pulse-height analyzer. Intensities were counted at 0.05° intervals in Bragg angle (20) and the counting period was 80 sec. Circular dichroism was measured by using a JASCO Automatic Recording Spectropolarimeter Model J-5.…”
Section: Methodsmentioning
confidence: 99%
“…The symmetrical-reflection method is profitable for obtaining a profile of the equatorial reflections of cast films having a planar orientation. 20 But this method has some difficulties in the range of a small diffraction angle. Figure 7 shows the plots of the integral breadth of the (100) reflection against the casting temperature, where the instrumental broadening was corrected by use of the (111) reflection of the silicon powder poured on the film surface.…”
Section: Influence Of Casting Temperature On Structure Of Pmdg Filmsmentioning
confidence: 99%