1999
DOI: 10.1002/(sici)1096-9918(199901)27:1<24::aid-sia457>3.0.co;2-n
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Glow discharge optical emission spectrometry (GDOES) depth profiling analysis of anodic alumina films—a depth resolution study

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Cited by 47 publications
(9 citation statements)
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“…Prior to anodizing, an aluminum plate was electropolished in solution containing HClO 4 and ethanol (1:4, v/v) at a constant voltage of 20 V for 5 min below 278 K. Then, the specimen was anodized in 0.1 mol dm -3 ammonium pentaborate ((NH 4 ) 2 B 10 O 16 ) at a constant current density of 5 mA cm -2 up to 200 V at 293 K, using a two-electrode cell with a platinum counter electrode. The alumina surface thus prepared was smooth and flat, as reported previously [27].…”
Section: Specimen Preparationmentioning
confidence: 62%
“…Prior to anodizing, an aluminum plate was electropolished in solution containing HClO 4 and ethanol (1:4, v/v) at a constant voltage of 20 V for 5 min below 278 K. Then, the specimen was anodized in 0.1 mol dm -3 ammonium pentaborate ((NH 4 ) 2 B 10 O 16 ) at a constant current density of 5 mA cm -2 up to 200 V at 293 K, using a two-electrode cell with a platinum counter electrode. The alumina surface thus prepared was smooth and flat, as reported previously [27].…”
Section: Specimen Preparationmentioning
confidence: 62%
“…The highest concentration of P (up to 3 at.%) was found in the middle (point B) of the anodic oxide film. Because the incorporated phosphorus had a tendency to migrate inwards, 11,12,32 there might be some P traps located in the middle layer of the oxide. In fact, Shimizu et al 2 has also reported the nonuniform distribution of phosphorus, revealing a complex variation with depth, within the anodic oxide based on glow discharge optical emission spectrometry (GDOES) depth profiling study.…”
Section: A Current and Voltage Transients During Anodizationmentioning
confidence: 99%
“…The properties of the oxides were found to depend on anodization electrolytes. It has been reported [8][9][10][11][12] that the anions in the electrolyte had the potential to be incorporated into the oxide during the film growth. As a result, there existed a possibility for the morphology, chemical composition, crystallinity, and electrochemical behavior of the aluminum anodic oxide to be significantly influenced.…”
Section: Introductionmentioning
confidence: 99%
“…These roughening effects bear also important implications in the dependence of the depth resolution on the coating thickness, during elemental analysis of multilayer stacks, as has been demonstrated experimentally in previous papers [28][29][30][31][32][33][34][35][36][37][38][39]. Moreover, there have been several attempts of modelling the effects of roughness during analysis of films and multilayers, based either in deconvolution techniques, or by theoretical calculation of the variation of the interface width, aiming to predict the broadening of the individual layers [40][41][42][43][44].…”
Section: Introductionmentioning
confidence: 99%