2014 International Conference on Mathematics and Computers in Sciences and in Industry 2014
DOI: 10.1109/mcsi.2014.48
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Goodness-of-Fit and Randomness Tests for the Sun's Emissions True Random Number Generator

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Cited by 2 publications
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“…electronic noise in semiconductor devices (e.g., thermal, diffusion, shot, avalanche, flicker, and generation/recombination noises) [95,145,[145][146][147][148][149][150][151]. In the same class of TRNGs, we can also include other approaches proposed in literature, using antennas, sensors, and transducers to retrieve stochastic signals from different sources like, for example, lasers, noisy images taken with digital cameras, the Sun radiation, or the atmosphere dynamics [152][153][154]. Depending on the exploited physical phenomenon, the implementation of these TRNGs involves the design of custom solutions expressively devised to process the stochastic signal, from the source to the output, differing case by case.…”
Section: Circuits To Measure Other Stochastic Physical Processesmentioning
confidence: 99%
“…electronic noise in semiconductor devices (e.g., thermal, diffusion, shot, avalanche, flicker, and generation/recombination noises) [95,145,[145][146][147][148][149][150][151]. In the same class of TRNGs, we can also include other approaches proposed in literature, using antennas, sensors, and transducers to retrieve stochastic signals from different sources like, for example, lasers, noisy images taken with digital cameras, the Sun radiation, or the atmosphere dynamics [152][153][154]. Depending on the exploited physical phenomenon, the implementation of these TRNGs involves the design of custom solutions expressively devised to process the stochastic signal, from the source to the output, differing case by case.…”
Section: Circuits To Measure Other Stochastic Physical Processesmentioning
confidence: 99%