This paper reports the nanoscale texture and microstructure of a high-performance NdFeAs(O,F) superconducting thin film grown by molecular beam epitaxy on a textured MgO/Y 2 O 3 /Hastelloy substrate. The NdFeAs(O,F) film forms a highly textured columnar grain structure by epitaxial growth on the MgO template. Although the film contains stacking faults along the abplane as well as grain boundaries perpendicular to the ab-plane, good superconducting properties are measured: a critical temperature, T c , of 46 K and a self-field critical current density, J c , of 2 × 10 6 A/cm 2 at 4.2 K. Automated crystal orientation mapping by scanning precession electron diffraction in transmission electron microscope is employed to analyze the misorientation angles between adjacent grains in a large ensemble (247 grains), and 99% of the grain boundaries show in-plane misorientation angles (Δγ) less than the critical angle θ c , which satisfies one of the necessary conditions for the high J c . Comparing the columnar grain size distribution with the mean distance of the flux line lattice, the triple junctions of low-angle grain boundaries are found to be effective pinning centers, even at high temperatures (≥35 K) and/or low magnetic fields.