Grain Orientation and Texture

Bunge, H. J.

doi:10.1201/b16940-45

Cited by 6 publications

(2 citation statements)

References 34 publications

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“…l This is the basis for most of all technological applications of materials. [2,9,33,34] These two aspects apply to all kinds of crystalline materials irrespective of their crystal structures and whether they are metallic, inorganic, or organic. [35,36] The physical reason behind both aspects is crystal anisotropy of the solid state processes on the left side of Figure 9 and of the properties on the right side.…”

Section: Two Aspects Of Orientation Stereology In Materials Sciencementioning

confidence: 99%

Orientation Stereology—A New Branch in Texture Research

Bunge

Schwarzer²

2001

Adv. Eng. Mater.

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A microstructure function, G(x), is introduced as a general description of microstructure by considering simultaneously the spatial arrangement of phases, i(x), of crystallographic orientations, g(x), as well as of lattice defects and residual stress, D(x). Particular emphasis is laid on the orientation–location distribution function, g(x), which is the quantification of orientation stereology. From this function the classical texture as well as the classical (grain) stereology can be derived (but not vice versa). Recently new techniques of diffraction scanning electron microscopy have been developed for the acquisition of g(x) with the scanning electron microscopy (SEM) and transmission electron microscopy (TEM).

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Section: Two Aspects Of Orientation Stereology In Materials Sciencementioning

confidence: 99%

Orientation Stereology—A New Branch in Texture Research

Bunge

Schwarzer²

2001

Adv. Eng. Mater.

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“…They allow the calculation of normal and inverse pole ®gures, important elastic and plastic materials properties, and tensorial properties in general. 6,8,9 The even and odd C coef®cients have been calculated, for triclinic sample symmetry and with a value of L~22, using an ODF program described elsewhere in detail, 10 from the database consisting of 10 000 individual grain orientations. A pronounced 111 ®bre texture is found.…”

Section: Application To Global Texture Measurementmentioning

confidence: 99%

Measurement of macrotexture by automated crystal orientation mapping: an alternative to X-ray diffraction

Schwarzer¹

2000

Materials Science and Technology

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Automated crystal orientation mapping (ACOM) with digital beam scan in the SEM enables crystal orientation mapping and quantitative texture analysis on large specimen areas of half a square centimetre wide or more, without sacri®cing accuracy of orientation measurement or spatial resolution, provided that program facilities for dynamic focusing of the beam, dynamic system calibration, and automatic ¯at ®elding for background correction are available. At present, the speed of ACOM exceeds 25 000 orientations per hour with cubic and hexagonal crystal symmetry. The orientation density function has been calculated using the data from ACOM measurement by series expansion under the assumption of triclinic sample symmetry and various spreads of the Gaussian function. ACOM competes well in speed and in results with X-ray diffraction, but is a more universal instrument owing to the additional facilities of SEM. Grain statistics are similar with both techniques since they depend on the ratio of average grain size to measured area. The advantages and limitations of macrotexture determination by ACOM are discussed.MST/4795

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Automated Evaluation of Kikuchi Patterns by Means of Radon and Fast Fourier Transformation, and Verification by an Artificial Neural Network

Schwarzer¹,

Sukkau

2003

Adv Eng Mater

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Automated crystal orientation measurement (ACOM) in the SEM by interpreting backscatter Kikuchi patterns (see Figure) has become a standard tool of quantitative texture analysis in materials science during the last decade. A Radon transformation of the diffraction pattern, in combination with a 1D fast Fourier transformation, enables the fast extraction of the positions of Kikuchi bands. The high‐frequency coefficients of the 1D FFT are used to define pattern quality as a measure of lattice imperfection and residual stress of the real crystal structure.

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Grain Orientation and Texture

Cited by 6 publications

References 34 publications

Orientation Stereology—A New Branch in Texture Research

Orientation Stereology—A New Branch in Texture Research

Measurement of macrotexture by automated crystal orientation mapping: an alternative to X-ray diffraction

Automated Evaluation of Kikuchi Patterns by Means of Radon and Fast Fourier Transformation, and Verification by an Artificial Neural Network

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