Grazing-incidence X-ray reflectivity on nanosized vanadium oxide and V/Ce oxide films

Grazing-incidence small-angle X-ray scattering and reflectivity on nanostructured oxide films

“…Thin TiO 2 , CeO 2 and V 2 O 5 and mixed oxides films on the glass substrate can be considered as aggregates containing nanoparticles or nanograins and pores [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15]. In this case, the SAXS is caused by the difference of electron density within and around the nanoparticles.…”

“…Our previous measurements of morphology of this material have shown its nanosized besides layered structure [9,34]. To make complete characterisation of interfaces in a layer structure of vanadium and V/Ce oxide films on glass substrates, we have performed grazing-incidence X-ray reflectivity (GIXR) [10].…”

“…The values of R and S s for all samples of V/Ce oxides for step of 0.1 • are presented in Ref. [10].…”

“…Three-dimensional plot of GISAXS curves in a sequence of fixed grazing angles for V 2 O 5 was drawn [10]. Corresponding to the GIXR data, from these measurements we have obtained grain sizes and specific surface areas for each step of grazing angle.…”

“…In our previous papers a number of experimental methods for resolving nanostructure of these materials were presented [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15]. Among them grazing-incidence small-angle X-ray scattering (GISAXS) was the best technique for complete morphological characterisation of nanostructured materials.…”