2007
DOI: 10.1016/j.jcrysgro.2006.10.122
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Growth and characterisation of GaAs/InGaAs/GaAs nanowhiskers on (111) GaAs

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Cited by 45 publications
(39 citation statements)
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“…An unintentional NW shell can harm device functionality by short circuiting axially designed components and by becoming a surrounding and competing recombination center [7] for charge carriers. Only by taking full control over radial growth can NWs be part of the future architecture for electronic devices.…”
Section: Introductionmentioning
confidence: 99%
“…An unintentional NW shell can harm device functionality by short circuiting axially designed components and by becoming a surrounding and competing recombination center [7] for charge carriers. Only by taking full control over radial growth can NWs be part of the future architecture for electronic devices.…”
Section: Introductionmentioning
confidence: 99%
“…The downscaling in the size of crystals that can be synthesized further opens the door to the development of devices that were not possible in two-dimensional (2D) epitaxial growth, such as highly mismatched heterostructures incorporated in the NWs [4,5]. Moreover, monolithic integration of III-V structures on group IV substrates [6,7] now becomes a viable path not only for performance enhancement of existing devices, but also incorporation of new functionalities.…”
Section: Introductionmentioning
confidence: 99%
“…The MOVPE growth of (InGa)As NW on GaAs substrate has been investigated to get information about the growth determining effects [2] and the (InGa)As composition with specific precursor supply [3]. Furthermore, structural and optical properties of GaAs/ (InGa)As/GaAs axial double-heterostructure NW have been studied [3,4]. Frequently, heterostructure growth is accompanied by characteristic phenomena like kinking, increased twin density, the formation of diffuse heterojunctions with alloy crystal gradients instead of abrupt interfaces [3,5], and growth along a side facet of the already grown NW [6,7].…”
Section: Introductionmentioning
confidence: 99%