“…Silane films on carbon materials have been examined previously using atomic force microscopy (AFM) [6,14], Fourier transform infrared spectroscopy (FTIR) [4,7,8,9,11,12,13], X-ray photoelectron spectroscopy (XPS) [7,8,9,13,14], transmission electron microscopy (TEM) [4,7,9,12,13], time-of-flight secondary ion mass spectroscopy (TOF-SIMS) [14], scanning electron microscopy (SEM) [8,9,14], X-ray diffraction (XRD) [8], Auger spectroscopy [15], and Raman spectroscopy [8,9]. The information from these previous studies can be combined to confirm the presence of the silane film and investigate the morphology and chemical composition of silanes on carbon materials.…”