1996
DOI: 10.1016/0039-6028(95)01073-4
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Growth mode and interface structure of Ag on the HF-treated Si(111):H surface

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Cited by 33 publications
(13 citation statements)
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“…This expectation is consistent with experimental observation for Ag growth on the H / Si͑111͒ surface, i.e., the VW mode. 2,[9][10][11] The diffusion barrier 0.27 eV for Ag migration inside a HUC on Si͑111͒ 7 ϫ 7, despite the presence of dangling bonds implying large binding energies, differs little from that for Ag on the H / Si͑111͒ surface. Looking into the diffusion pathways in Fig.…”
Section: Discussionmentioning
confidence: 99%
See 1 more Smart Citation
“…This expectation is consistent with experimental observation for Ag growth on the H / Si͑111͒ surface, i.e., the VW mode. 2,[9][10][11] The diffusion barrier 0.27 eV for Ag migration inside a HUC on Si͑111͒ 7 ϫ 7, despite the presence of dangling bonds implying large binding energies, differs little from that for Ag on the H / Si͑111͒ surface. Looking into the diffusion pathways in Fig.…”
Section: Discussionmentioning
confidence: 99%
“…[4][5][6][7][8] In contrast, the Ag growth mode on the H-terminated Si͑111͒ surface changes the Volmer-Weber ͑VW͒ mode, in which three-dimensional Ag islands are formed. 2,[9][10][11] It is commonly argued that the mobility of the adsorbed metal adatoms is enhanced on the H-terminated Si͑111͒ surface compared to that on the clean Si͑111͒ surface. 4,12 Scanning-tunneling microscopy ͑STM͒ studies showed that the mobility of the metal adatoms between the half-unit cells ͑HUC's͒ of Si͑111͒ 7 ϫ 7 is much lower than that inside a HUC.…”
Section: Introductionmentioning
confidence: 99%
“…Thus, in this study, we theoretically investigate the roles of H atoms in metal growth, focusing on H segregation for Ag on the H-terminated Si͑111͒ surface, which has been extensively studied in the last decades from both academic and practical points. 1, 3,4,[13][14][15][16][17][18][19] As for H position in the Ag growth on the H / Si͑111͒ surface, there are two different arguments. The first one states that the H layer remains at the Ag-Si interface even at the later stages of overlayer growth.…”
Section: Introductionmentioning
confidence: 99%
“…It has been suggested that hydrogen at the interface can be partially removed during Ag deposition at high temperatures. [22][23][24] If the hydrogen coverage at the interface would decrease below 0.3 ML, an undesired reconstruction of the surface, to a 2D layer of the Si(111) √ 3x √ 3-Ag structure plus thicker Ag(111) islands could occur. 22,25 So, it would be desirable to lower the Ag temperature deposition in order to avoid a significant hydrogen elimination at the interface, and therefore the above-mentioned surface reconstruction.…”
mentioning
confidence: 99%