2010
DOI: 10.1016/j.tsf.2010.05.055
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Growth of 3C–SiC on Si(111) using the four-step non-cooling process

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Cited by 7 publications
(5 citation statements)
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“…In Fig. 20, comparing the SiC selected area diffraction results to those in [11] revealed that the crystal phase was a simple cubic structure and the Miller index was 111, which accords with the relevant literature. The result of the selected area diffraction was veri ed to be β-SiC bers because the β crystal phase was in a simple cubic structure.…”
Section: Sem Analysis Of Sic Berssupporting
confidence: 84%
“…In Fig. 20, comparing the SiC selected area diffraction results to those in [11] revealed that the crystal phase was a simple cubic structure and the Miller index was 111, which accords with the relevant literature. The result of the selected area diffraction was veri ed to be β-SiC bers because the β crystal phase was in a simple cubic structure.…”
Section: Sem Analysis Of Sic Berssupporting
confidence: 84%
“…The selected area diffraction and the crystal lattice of SiC fibers are displayed in Figure 12, respectively. In Figure 12a, comparing the SiC selected area diffraction results to those in relevant literature [15] revealed that the crystal phase was a simple cubic structure and the Miller index was 111. The result of the selected area diffraction was verified to be β ‐SiC fibers because the β crystal phase was in a simple cubic structure.…”
Section: Resultsmentioning
confidence: 87%
“…[37] On the other hand, the stress-free 3C-SiC used is a (111) single-crystal substrate grown by chemical vapor deposition (CVD). [42,43] The Raman peak position of the stress-free 3C-SiC is observed at 797.0 cm −1 .…”
Section: Resultsmentioning
confidence: 99%