“…11) In the previous report, the K content, x, dependency of the electrical properties were observed as well as the crystal structure. However, this investigation had been imperfect because the film thickness of (K x Na 1¹x )NbO 3 films prepared under fixed reaction condition varied with x value.…”
Section: )9)mentioning
confidence: 92%
“…In this case, the difference in lattice The closed triangles indicate the out-of-plane lattice spacing for the previous report of (K x Na 1¹x )NbO 3 films with various thickness. 11) Dashed lines indicate the out-of-plane lattice spacing of (K x Na 1¹x )NbO 3 powder. 16) spacing of the film with powder one in Fig.…”
Epitaxial (K x Na 1¹x )NbO 3 films with 3¯m in thickness were deposited at 240°C on (100) c SrRuO 3 //(100)SrTiO 3 substrates by hydrothermal method. XRD patterns and Raman spectra were systematically changed with increasing x values. XRD patterns and Raman spectra was not dramatically changed by the annealing treatment at 600°C for 10 min under O 2 atmosphere. On the other hand, the electrical and piezoelectric properties were improved by this annealing treatment; leakage current density was diminished and longitudinal piezoelectric response was increased to 69 pm/V at x = 0.51.
“…11) In the previous report, the K content, x, dependency of the electrical properties were observed as well as the crystal structure. However, this investigation had been imperfect because the film thickness of (K x Na 1¹x )NbO 3 films prepared under fixed reaction condition varied with x value.…”
Section: )9)mentioning
confidence: 92%
“…In this case, the difference in lattice The closed triangles indicate the out-of-plane lattice spacing for the previous report of (K x Na 1¹x )NbO 3 films with various thickness. 11) Dashed lines indicate the out-of-plane lattice spacing of (K x Na 1¹x )NbO 3 powder. 16) spacing of the film with powder one in Fig.…”
Epitaxial (K x Na 1¹x )NbO 3 films with 3¯m in thickness were deposited at 240°C on (100) c SrRuO 3 //(100)SrTiO 3 substrates by hydrothermal method. XRD patterns and Raman spectra were systematically changed with increasing x values. XRD patterns and Raman spectra was not dramatically changed by the annealing treatment at 600°C for 10 min under O 2 atmosphere. On the other hand, the electrical and piezoelectric properties were improved by this annealing treatment; leakage current density was diminished and longitudinal piezoelectric response was increased to 69 pm/V at x = 0.51.
“…There are some reports that ¾ r increases with increases in the film thickness. 22) It is therefore considered that the hydrothermally-deposited (K, Na)NbO 3 films also showed the same tendency. In addition, a low dielectric loss of below 0.13 was observed in this frequency region.…”
Section: )28)mentioning
confidence: 95%
“…We also report the effect of repeated deposition on the composition, microstructure, and crystal structure. 22) These source materials and substrates were sealed in an autoclave, which was set in a thermostat bath maintained at 240°C for 6 h. After the obtained films were removed from the autoclave, they were washed ultrasonically in distilled water, ethanol, acetone, and methanol, and then dried at 150°C for 1 h in air. In this study, the hydrothermal process from deposition to drying was defined as one cycle, which was repeated for nine cycles to obtain the final films.…”
Section: )19)mentioning
confidence: 99%
“…This value was smaller than the value (= 17¯C/cm 2 ) for the hydrothermally-deposited (K 0.88 Na 0.12 )NbO 3 film with a thickness of 6¯m. 22) In addition, the PE hysteresis loops were imprinted to the negative electric field region. In our previous report, it was observed that PE hysteresis loops of 6¯m-thick (K 0.88 Na 0.12 )NbO 3 film were imprinted to the negative electric field region.…”
{001} c -oriented (K 0.86 Na 0.14 )NbO 3 thick films were prepared at 240°C on (100) c SrRuO 3 //(100)SrTiO 3 substrates by repeated hydrothermal deposition technique. The film thickness was found to increase linearly with the number of deposition cycles, and 60¯m-thick film was obtained after nine repetitions of the deposition. The K/(K+Na) ratio of the deposited thick films, measured by X-ray fluorescence spectroscopy, showed constant values regardless of the number of deposition cycles. Cross-sectional scanning electron microscopy images revealed uniformity of the obtained dense films with no obvious micro cracks and pores. Structural characterization based on X-ray diffraction, XRD 2ª-½ patterns and X-ray pole figure measurement, showed that the epitaxial relationship between the films and substrates with a {001} c orientation was maintained throughout the deposition cycles. In addition, cross-sectional Raman spectra showed that 60¯m-thick (K 0.86 Na 0.14 )NbO 3 film had an orthorhombic structure. The dielectric constant, ¾ r , and tan ¤ showed frequency dependence. The average remanent polarization measured at 100 Hz was 8¯C/cm 2 .
Pyroelectric nanogenerators fabricated using a lead-free KNbO(3) nanowire-PDMS polymer composite are reported for the first time. The voltage/current output of the nanogenerators can be controlled by electric fields and enhanced by increasing the rate of change in temperature. The fabricated nanogenerators can be used to harvest energy from sunlight illumination and have potential applications in self-powered nanodevices and nanosystems.
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