2007
DOI: 10.1016/j.mee.2007.01.118
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Growth of InAs quantum-dot hatches on InGaAs/GaAs cross-hatch virtual substrates

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Cited by 12 publications
(5 citation statements)
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“…Actually, it has been reported that dislocations can result in spontaneously ordered distribution of QDs in Si/Ge, GaAs/ InAs, and PbTe/PbSe systems. [15][16][17][18][19] However, to the best knowledge of the authors, so far, there are no reports discussing dislocation-induced self-assembly of QDs in InGaN/ GaN system. In this work, InGaN nano-flowers are grown on GaN by metal organic vapor phase epitaxy (MOVPE).…”
mentioning
confidence: 99%
“…Actually, it has been reported that dislocations can result in spontaneously ordered distribution of QDs in Si/Ge, GaAs/ InAs, and PbTe/PbSe systems. [15][16][17][18][19] However, to the best knowledge of the authors, so far, there are no reports discussing dislocation-induced self-assembly of QDs in InGaN/ GaN system. In this work, InGaN nano-flowers are grown on GaN by metal organic vapor phase epitaxy (MOVPE).…”
mentioning
confidence: 99%
“…QDs on InGaAs CHPs leads to spontaneous alignment of QDs along the cross-hatches. Main parameters used to control/optimize QDs alignment are growth interruption which affects the orderliness of QDs on the hatches [16], crosshatch layer thickness, and composition which affect MD line density [17], growth rates, excess growth, and the use of spacer layer prior to QD growth [18]. The origin and evolution of InAs QD alignment on InGaAs CHPs, which apply to other material systems, are now well understood [19,20].…”
Section: Quantum Dots On Cross-hatch Patterns Growth Of Inasmentioning
confidence: 99%
“…InAs QDs are useful as single photon sources and detectors [7,8]. The growth of InAs QDs on lattice-mismatched InGaAs/GaAs substrates has been demonstrated [9][10][11], but the detail of their formation has been lacking [12] II. EXPERIMENTAL DETAILS All growth takes place in a solid-source MBE system (Riber 32P) with in-situ surface monitoring via reflection high-energy electron diffraction (RHEED).…”
Section: Introductionmentioning
confidence: 99%