Anodized layers on InAsSb, InSb, and InAs surfaces are characterized using phase modulation spectroscopic ellipsometry in a wide spectral range from 0.6 to 6.5 eV. Single crystal InAs0.04Sb0.94 layer was grown using melt‐epitaxy (ME). Optical properties of anodized layer prepared on InAsSb single crystal are compared with those on pure single crystals of InAs and InSb. Ellipsometric spectra of were fitted to the Tauc‐Lorentz model describing the anodizing layer optical functions. Clear tendency of ultraviolet shift of the band gap energy with decreasing antimony content is observed. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)