2006
DOI: 10.1063/1.2360899
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Growth of long wavelength InxGa1−xAsySb1−y layers on GaAs from liquid phase

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Cited by 9 publications
(11 citation statements)
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“…The growth setup used has been described in detail in previous papers [9,10]. Growth was initiated from a pseudo-quaternary melt comprising of binaries, InSb, GaSb and InAs on a binary substrate (GaAs in this case).…”
Section: Methodsmentioning
confidence: 99%
“…The growth setup used has been described in detail in previous papers [9,10]. Growth was initiated from a pseudo-quaternary melt comprising of binaries, InSb, GaSb and InAs on a binary substrate (GaAs in this case).…”
Section: Methodsmentioning
confidence: 99%
“…The thicknesses of these epilayers are about 2-10 m. The dislocation densities observed in these thin films are as high as the order of 10 7 cm -2 that are caused by a large lattice mismatch (Kumar et al, 2006). It markedly lowers the terminal performance of the detectors.…”
Section: Introductionmentioning
confidence: 99%
“…Thus it is very difficult to grow high-quality InAsSb single crystals with cutoff wavelengths of 8-12 m using conventional technologies (Kumar et al, 2006). Narrow-gap InAsSb epilayers have been grown by molecular beam epitaxy (MBE) (Chyi et al, 1988), metalorganic chemical vapor deposition (MOCVD) (Kim et al, 1996), and liquid phase epitaxy (LPE) (Dixit et al, 2004).…”
Section: Introductionmentioning
confidence: 99%
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“…Alternative candidates for infrared applications in the spectral range 8 − 12 µm are InAsSb ternary alloys. Despite difficulty originating from large lattice mismatch between InAsSb epitaxial layers and binary compound substrates, the InAs 1−x Sb x epitaxial layers with x ≈ 0.95 and the cutoff wavelength ranging from 8 to 12 µm have been successively grown using liquid phase epitaxy [1][2][3][4]. Recently, high quality crystal layers were grown using the melt epitaxy [5,6].…”
mentioning
confidence: 99%