2012
DOI: 10.1016/j.apsusc.2012.02.125
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Growth of thin zirconium oxide films on the 6H–SiC(0001) surface

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Cited by 3 publications
(1 citation statement)
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“…The C 1s spectrum of SPMF04 (Fig. 12a) was fitted with four components centered at 283.0, 284.3, 285.5 and 287.3 eV, associated to carbon atoms in C-Si [52], [53], C-C [54], [55], C-O [52], [56], and C-P [55], [57]. These signals then correspond to carbon in the propyl chain (C-Si, C-C and C-O) and the methyl linked to the phosphonate group (C-P).…”
Section: Xps Analysis Resultsmentioning
confidence: 99%
“…The C 1s spectrum of SPMF04 (Fig. 12a) was fitted with four components centered at 283.0, 284.3, 285.5 and 287.3 eV, associated to carbon atoms in C-Si [52], [53], C-C [54], [55], C-O [52], [56], and C-P [55], [57]. These signals then correspond to carbon in the propyl chain (C-Si, C-C and C-O) and the methyl linked to the phosphonate group (C-P).…”
Section: Xps Analysis Resultsmentioning
confidence: 99%