2016
DOI: 10.1016/j.physb.2015.12.024
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Hall effect in hopping regime

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Cited by 20 publications
(15 citation statements)
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“…Furthermore, in general, the Hall effect for hopping conduction is not well understood yet. While the Hall effect for free‐carrier conduction is caused by the classical Lorenz force, that for hopping conduction is due to the self‐interference effect of the electron wave function between the paths for two‐site and three‐site hopping, as has been shown firstly by Holstein, then by Németh and Mühlschlegel as well as by Galperin et al, and most recently by Avdonin et al While the calculation method of the Hall factor for free‐carrier conduction has been established on the basis of relaxation‐time approximation, that for hopping conduction has not been established yet. It is, therefore, necessary to compare the theoretically calculated results with the experimental results of Hall‐effect measurements.…”
Section: Introductionmentioning
confidence: 99%
“…Furthermore, in general, the Hall effect for hopping conduction is not well understood yet. While the Hall effect for free‐carrier conduction is caused by the classical Lorenz force, that for hopping conduction is due to the self‐interference effect of the electron wave function between the paths for two‐site and three‐site hopping, as has been shown firstly by Holstein, then by Németh and Mühlschlegel as well as by Galperin et al, and most recently by Avdonin et al While the calculation method of the Hall factor for free‐carrier conduction has been established on the basis of relaxation‐time approximation, that for hopping conduction has not been established yet. It is, therefore, necessary to compare the theoretically calculated results with the experimental results of Hall‐effect measurements.…”
Section: Introductionmentioning
confidence: 99%
“…A fact that high density of free holes (p > 0.8 × 10 20 cm -3 ) in the crystalline state estimated from the Hall effect measurements (at 300 K) indicates that the transport is dominated by free carriers. If, on the other hand, the states are localized, such a large p should not be obtained from the Hall measurements, i.e., hopping of localized carriers does not produce such a large p (Avdonin et al 2016;Mott 1993;Mott, Davis 1979).…”
Section: Metal-insulator Transitionmentioning
confidence: 99%
“…We should note that we also calculated T j and l j for the experimental data 84 on a ZnO crystal, containing processrelated donors with the concentration N % 6.6 Â 10 18 cm À3 , compensation ratio K % 0.2, and thermal ionization energy I d % 18.3 meV. According to the experiment: l H (T j ) ¼ 73 cm 2 / (V s) at T j ¼ 95 K. The calculation using Eq.…”
Section: Drift Mobility Of V-band Holes In the Regime Of Their Jumping (Turbulent Relay) Migration Via Acceptorsmentioning
confidence: 99%