2008
DOI: 10.1590/s0103-97332008000100027
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Hall Effect measurements on p-n-p InP structures

Abstract: The electrical properties of p-type layers of indium phosphide (InP), formed by the diffusion of zinc into n-type material, are studied by Hall Effect measurements. A wide range of diffusion conditions are used and both homogeneously doped specimens and those containing a zinc atom concentration gradient are produced. A non-correspondence of atom and carrier concentrations is indicated, confirming previous four point resistivity studies. Carrier profiles are achieved by both serial sectioning and multiple spec… Show more

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Cited by 4 publications
(3 citation statements)
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“…Their values are determined using experimental data reported in Refs. and [26][27][28][29][30][31]35], respectively. The rest of the electrical conductivities are taken from Refs.…”
Section: Theoretical Modelmentioning
confidence: 99%
“…Their values are determined using experimental data reported in Refs. and [26][27][28][29][30][31]35], respectively. The rest of the electrical conductivities are taken from Refs.…”
Section: Theoretical Modelmentioning
confidence: 99%
“…Using the data of [25,[32][33][34][35][36][37][38][39], we calculate electron mobility in Si-and Zn-doped InP from the following relations:…”
Section: Materials Parameters Used In the Electrical Modelmentioning
confidence: 99%
“…The relation between the free hole concentration in Zndoped InP and the acceptor concentration N a is taken from [39]:…”
Section: Materials Parameters Used In the Electrical Modelmentioning
confidence: 99%