2019
DOI: 10.1002/adem.201900429
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Hall–Petch Relations of Severely Deformed Cu, Ni, and Cu–Ni Alloys: Analysis of the Dislocation Blockage Strength of Deformation‐Modified Grain Boundaries

Abstract: Cu–Ni alloys and pure Cu and Ni are processed by severe plastic deformation up to different selected strain levels. States of varying grain sizes and hardnesses are adjusted by selecting the total torsional strain up to saturation and subsequent thermal annealing. The hardnesses of the annealed saturation‐deformed microstructures can be described by Hall–Petch parameters valid for relaxed coarse‐grained samples. The processing conditions determine the Hall–Petch parameters in a similar way for each composition… Show more

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Cited by 12 publications
(3 citation statements)
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“…Based on the TEM results, which showed even finer grains, we propose that another factor, i.e., the inverse Hall-Petch effect, may to some extent contribute to the deterioration of the mechanical properties. Several researchers [25][26][27][28][29][30] have observed and reported the inverse Hall-Petch effect in Cu. According to these publications, the Hall-Petch relation breaks down in submicron grain-sized materials.…”
Section: Discussionmentioning
confidence: 99%
“…Based on the TEM results, which showed even finer grains, we propose that another factor, i.e., the inverse Hall-Petch effect, may to some extent contribute to the deterioration of the mechanical properties. Several researchers [25][26][27][28][29][30] have observed and reported the inverse Hall-Petch effect in Cu. According to these publications, the Hall-Petch relation breaks down in submicron grain-sized materials.…”
Section: Discussionmentioning
confidence: 99%
“…The yield strength of oxygen-free copper wire annealed at 210 C for 8 h was 82.995 MPa, so the value of k could be calculated as 129.84 MPa μm À1/2 according to Equation (3). Some studies showed that the k value is between 110 and 160 MPa μm À1/2 , [20][21][22][23] thus the calculated value of k can be considered credible. According to the calculated value of k, the grain strengthening values of oxygen-free copper wires annealing at different temperatures were quantitatively expressed, and the grain boundary strengthening values were is listed in Figure 10.…”
Section: Grain Boundary Strengthening Of Annealed Oxygen-free Copper ...mentioning
confidence: 99%
“…Further increase in the number of ECAP pass has a negligible impact on the increase in hardness value. 36…”
Section: Mechanical Characterizationmentioning
confidence: 99%