Handling of Multiple‐Wave Effects in the Measurement of Forbidden X‐Ray Reflections in TeO<sub>2</sub>

Kozlovskaya, K. A.; Kulikov, A. S.; Новиков, Д. В.; Овчинникова, Е. Н.; Ustyugov, Alexey M.; Дмитриенко, В. Е.

doi:10.1002/crat.202000195

Cited by 4 publications

(3 citation statements)

References 38 publications

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“…We see a good agreement between the measured and calculated curves, which confirms the correctness of the used approach taken into account only the three-waves scattering. Jmulti was also applied to simulate the three-waves multiple peaks positions on the azimuthal dependence of the intensity of 002 reflection in paratellurite [38]. The calculation showed good agreement with the experiment made at the P23 beamline of the PETRA III synchrotron facility with linear polarization [40].…”

Section: Modelling Of Three-wave Multiple Reflections With Circular Polarizationsmentioning

confidence: 63%

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Determination of Absolute Structure of Chiral Crystals Using Three-Wave X-ray Diffraction

et al. 2021

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We propose a new method to determine the absolute structure of chiral crystals, which is based on the chiral asymmetry of multiple scattering diffraction. It manifests as a difference in the azimuthal dependence of the forbidden Bragg reflection intensity measured with left and right circularly polarized X-ray beams. Contrary to the existing ones, the suggested method does not use X-ray anomalous dispersion. The difference between the Renninger scans with circularly polarized X-rays has been experimentally demonstrated for the 001 reflection intensities in the right- and left-handed quartz single crystals. A Jmulti-based code on model-independent three-wave-diffraction approach has been developed for quantitative description of our experimental results. The proposed method can be applied to various structures including opaque, organic and monoatomic crystals, even with only light elements. To determine the type of isomer, the Renninger plot of a single forbidden reflection is sufficient.

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Section: Modelling Of Three-wave Multiple Reflections With Circular Polarizationsmentioning

confidence: 63%

“…Substituting D 0 and D n into Equation (2), we obtain the multiple-wave contribution to the charge scattering tensor considered reflection Q [36][37][38]:…”

Section: Methods Descriptionmentioning

confidence: 99%

Determination of Absolute Structure of Chiral Crystals Using Three-Wave X-ray Diffraction

et al. 2021

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“…Recently, Kozlovskaya et al (2021) presented an approach to avoid MBD a priori. Prior to the measurements, they calculated so-called Renninger maps displaying the intensity depending on both X-ray energy and azimuth angle (Weckert & Hu ¨mmer, 1997;Dmitrienko, 2009;Ovchinnikova et al, 2020;Richter, 2021;Walz, 2011).…”

Section: Introductionmentioning

confidence: 99%

Treatment of multiple-beam X-ray diffraction in energy-dependent measurements

Nentwich,

Zschornak,

Weigel

et al. 2024

J Synchrotron Radiat

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During X-ray diffraction experiments on single crystals, the diffracted beam intensities may be affected by multiple-beam X-ray diffraction (MBD). This effect is particularly frequent at higher X-ray energies and for larger unit cells. The appearance of this so-called Renninger effect often impairs the interpretation of diffracted intensities. This applies in particular to energy spectra analysed in resonant experiments, since during scans of the incident photon energy these conditions are necessarily met for specific X-ray energies. This effect can be addressed by carefully avoiding multiple-beam reflection conditions at a given X-ray energy and a given position in reciprocal space. However, areas which are (nearly) free of MBD are not always available. This article presents a universal concept of data acquisition and post-processing for resonant X-ray diffraction experiments. Our concept facilitates the reliable determination of kinematic (MBD-free) resonant diffraction intensities even at relatively high energies which, in turn, enables the study of higher absorption edges. This way, the applicability of resonant diffraction, e.g. to reveal the local atomic and electronic structure or chemical environment, is extended for a vast majority of crystalline materials. The potential of this approach compared with conventional data reduction is demonstrated by the measurements of the Ta L 3 edge of well studied lithium tantalate LiTaO3.

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Determination of the Absolute Configuration of Monoatomic Chiral Crystals Using Three-Wave X-ray Diffraction

Kozlovskaya,

Ovchinnikova,

Ustyugov

et al. 2023

Crystallogr. Rep.

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Handling of Multiple‐Wave Effects in the Measurement of Forbidden X‐Ray Reflections in TeO₂

Cited by 4 publications

References 38 publications

Determination of Absolute Structure of Chiral Crystals Using Three-Wave X-ray Diffraction

Determination of Absolute Structure of Chiral Crystals Using Three-Wave X-ray Diffraction

Treatment of multiple-beam X-ray diffraction in energy-dependent measurements

Determination of the Absolute Configuration of Monoatomic Chiral Crystals Using Three-Wave X-ray Diffraction

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Handling of Multiple‐Wave Effects in the Measurement of Forbidden X‐Ray Reflections in TeO2

Cited by 4 publications

References 38 publications

Determination of Absolute Structure of Chiral Crystals Using Three-Wave X-ray Diffraction

Determination of Absolute Structure of Chiral Crystals Using Three-Wave X-ray Diffraction

Treatment of multiple-beam X-ray diffraction in energy-dependent measurements

Determination of the Absolute Configuration of Monoatomic Chiral Crystals Using Three-Wave X-ray Diffraction

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Handling of Multiple‐Wave Effects in the Measurement of Forbidden X‐Ray Reflections in TeO₂