Hard-X-Ray Lensless Imaging of Extended Objects

Rodenburg, J. M.; Hurst, A C; Cullis, A. G.; Dobson, B. R.; Pfeiffer, Franz; Bunk, Oliver; Dávid, Christian; Jefimovs, Konstantins; Johnson, I.

doi:10.1103/physrevlett.98.034801

Cited by 803 publications

(506 citation statements)

References 19 publications

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“…Because of the need of a support surrounding the sample, constrained by the oversampling criterion, it has a limited field of view. Scanning versions of CXD based on the ideas of ''ptychography'' 58) can solve this problem, but are still not fully developed for imaging strains. Another general limitation is the need to extend CXD to the case of large strains, with displacements bigger than a lattice spacing.…”

Section: Future Directions Of Cxdmentioning

confidence: 99%

Nanoparticle Structure by Coherent X-ray Diffraction

Robinson

2013

J. Phys. Soc. Jpn.

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This review examines the physical reasons why nanoparticles differ in structure from the bulk. Certain simple properties of nanoparticles are explained through these structural differences. A powerful method of measuring the three dimensional structure of nanoparticles, Coherent X-ray diffraction (CXD), is introduced. A key experiment is described that uses CXD to study the redistribution of strains on the surface of a Au nanocrystal. Some future perspectives are discussed in conclusion.

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Section: Future Directions Of Cxdmentioning

confidence: 99%

Nanoparticle Structure by Coherent X-ray Diffraction

Robinson

2013

J. Phys. Soc. Jpn.

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“…This phase retrieval approach has been successfully used for in-situ [6,7] Recently, x-ray Bragg ptychography methods have been developed that eliminate the requirement for isolated crystals and accommodate a broader range of samples. Originally proposed for electron microscopy [9,10] and developed extensively with x-rays in the transmission geometry [11,12], the present form of ptychography consists of inverting a set of far-field diffraction intensity patterns collected from overlapping regions of the sample illuminated with a localized beam. Thus, specific regions of interest can be imaged in continuous samples.…”

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confidence: 99%

High-resolution three-dimensional structural microscopy by single-angle Bragg ptychography

et al. 2016

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We present an efficient method of imaging 3D nanoscale lattice behavior and strain fields in crystalline materials with a new methodology -three dimensional Bragg projection ptychography (3DBPP). In this method, the 2D sample structure information encoded in a coherent high-angle Bragg peak measured at a fixed angle is combined with the real-space scanning probe positions to reconstruct the 3D sample structure. This work introduces an entirely new means of three dimensional structural imaging of nanoscale materials and eliminates the experimental complexities associated with rotating nanoscale samples. We present the framework for the method and demonstrate our approach with a numerical demonstration, an analytical derivation, and an experimental reconstruction of lattice distortions in a component of a nanoelectronic prototype device.Inversion methods provide a powerful alternative to traditional objective-lens-based microscopy. Techniques that numerically invert coherent diffraction patterns into real space images have provided substantial gains in resolution and sensitivity in certain optical, electron, and x-ray microscopy experiments, especially where image-forming lenses are inefficient or difficult to incorporate. The resulting images, formed by inverting reciprocal space diffraction patterns, contain quantitative information that encodes local physical parameters such as permittivity, density, and atomic displacement at sub-beam-size spatial resolutions.When implemented with hard x-rays, these coherent diffraction imaging (CDI) techniques have enhanced our understanding of the internal structure of nano-and meso-scale materials, especially in operating environments that are difficult to access with other probes. Furthermore, x-ray microscopy methods based on Bragg diffraction are of particular interest because the sensitivity of x-rays to crystalline distortions in materials can be leveraged to reveal the interplay between structure and properties without disturbing environmental boundary conditions. However, the routine application of inversion methods to coherent hard x-ray Bragg diffraction is still limited by stringent experimental requirements and long measurement times.Given the potential impact of non-destructive 3D structural microscopy and the limitations of current 3D Bragg coherent x-ray inversion methods, advances in Bragg phase retrieval methods that facilitate the rapid imaging of crystal lattice behavior in realistic environments are critically important. Here, we introduce a new coherent Bragg diffraction imaging approach, three dimensional Bragg projection ptychography (3DBPP), that provides such a capability. 3DBPP enables 3D image reconstruction from a series of 2D Bragg diffraction patterns measured at a single incident beam angle, thus forming a new mode of inversion-based 3D strain-sensitive imaging. As we discuss in this article, 3DBPP is a hybrid real / reciprocal space technique that takes advantage of the high angle of separation between the incident and diffracted beam in a Bra...

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“…It is important to distinguish the KCDI approach with an illumination-defined region of interest from the ptychography method 15 . The ptychographical algorithm uses the additional information provided by the overlap of many diffraction patterns from adjacent regions to reconstruct an image.…”

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confidence: 99%

Keyhole coherent diffractive imaging

et al. 2008

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The availability of third-generation synchrotrons and ultimately X-ray free-electron lasers 1 is driving the development of many new methods of microscopy. Among these techniques, coherent diffractive imaging (CDI) is one of the most promising, offering nanometre-scale imaging of non-crystallographic samples. Image reconstruction from a single diffraction pattern has hitherto been possible only for small, isolated samples, presenting a fundamental limitation on the CDI method. Here we report on a form of imaging we term 'keyhole' CDI, which can reconstruct objects of arbitrary size. We demonstrate the technique using visible light and X-rays, with the latter producing images of part of an extended object with a detectorlimited resolution of better than 20 nm. Combining the improved resolution of modern X-ray optics with the wavelength-limited resolution of CDI, the method paves the way for detailed imaging of a single quantum dot or of a small virus within a complex host environment.

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Hard-X-Ray Lensless Imaging of Extended Objects

Cited by 803 publications

References 19 publications

Nanoparticle Structure by Coherent X-ray Diffraction

Nanoparticle Structure by Coherent X-ray Diffraction

High-resolution three-dimensional structural microscopy by single-angle Bragg ptychography

Keyhole coherent diffractive imaging

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