Hard x-ray nanofocusing with refractive x-ray optics: full beam characterization by ptychographic imaging

Schroer, Christian G.; Brack, Florian‐Emanuel; Brendler, Roman; Hönig, Susanne; Hoppe, Robert; Patommel, Jens; Ritter, Stephan; Scholz, Maria Brígida dos Santos; Schropp, Andreas; Seiboth, Frank; Nilsson, Daniel; Rahomäki, Jussi; Uhlén, Fredrik; Vogt, Ulrich; Reinhardt, Juliane; Falkenberg, Gerald

doi:10.1117/12.2024127

Cited by 12 publications

(11 citation statements)

References 35 publications

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“…5 Focusing X-ray optics is commonly based either on curved crystal mirrors, [6][7][8] Fresnel zone plates, 9 or compound refractive lenses (CRLs). 10 Using CRLs for microscopy has the advantage of high efficiency, and scalability to higher energy x-rays, 11 which is beneficial when sample transmission is a limiting factor. While combination of CRLs with diffractive optics can be arranged to correct chromatic aberration, the introduction of a diffractive element in the microscope gives rise to a considerable loss of photons.…”

mentioning

confidence: 99%

Correcting lateral chromatic aberrations in non-monochromatic X-ray microscopy

Falch

Detlefs

Michiel

et al. 2016

Applied Physics Letters

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Lateral chromatic aberration in microscopy based on refractive optics may be reduced significantly by adjustments to the illumination scheme. By taking advantage of a broadened bandwidth illumination, the proposed scheme could open for x-ray microscopy with spatial resolution in the range 150–200 nm at millisecond frame rates. The scheme is readily implemented and is achievable using only standard refractive x-ray lenses, which has the advantage of high efficiency. It also maximizes the transmission and removes the spatial filtering effects associated with absorption in x-ray lenses.

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mentioning

confidence: 99%

Correcting lateral chromatic aberrations in non-monochromatic X-ray microscopy

Falch

Detlefs

Michiel

et al. 2016

Applied Physics Letters

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“…There are many different nanofocusing X-ray optics available today, exploiting reflection (Jarre et al, 2005;Mimura et al, 2007), diffraction (Chu et al, 2008;Kang et al, 2008;Mimura et al, 2010;Vila-Comamala et al, 2011;Yan et al, 2011) and refraction (Schroer et al, 2005(Schroer et al, , 2013. Nanofocusing refractive X-ray lenses are used in the scanning microscopes at beamline ID13 of the ESRF, and beamline P06 of PETRA III .…”

Section: Focusing By Parabolic Refractive X-ray Lensesmentioning

confidence: 99%

“…Parabolic refractive X-ray lenses and their imaging properties were previously described in detail (Lengeler et al, 1999;Kohn, 2003;Schroer et al, 2013). In the case of nanofocusing, they can typically not be considered as thin optics.…”

Section: Focusing By Parabolic Refractive X-ray Lensesmentioning

confidence: 99%

“…In the case of nanofocusing, they can typically not be considered as thin optics. However, their particular imaging properties (Kohn, 2003;Schroer et al, 2013) allow one to replace the thick optic with an effective Gaussian thin-object transmission model in the case of nanofocusing, i.e. when the source-to-lens distance L 1 is much larger than the focal length.…”

Section: Focusing By Parabolic Refractive X-ray Lensesmentioning

confidence: 99%

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Hard X-ray nanofocusing at low-emittance synchrotron radiation sources

Schroer

Falkenberg

2014

J Synchrotron Radiat

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X-ray scanning microscopy relies on intensive nanobeams generated by imaging a highly brilliant synchrotron radiation source onto the sample with a nanofocusing X-ray optic. Here, using a Gaussian model for the central cone of an undulator source, the nanobeam generated by refractive X-ray lenses is modeled in terms of size, flux and coherence. The beam properties are expressed in terms of the emittances of the storage ring and the lateral sizes of the electron beam. Optimal source parameters are calculated to obtain efficient and diffraction-limited nanofocusing. With decreasing emittance, the usable fraction of the beam for diffraction-limited nanofocusing experiments can be increased by more than two orders of magnitude compared with modern storage ring sources. For a diffraction-limited storage ring, nearly the whole beam can be focused, making these sources highly attractive for X-ray scanning microscopy.

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“…14 The technique can not only be applied at modern third generation synchrotron radiation sources, 15,16 but also at XFELs.…”

Section: Introductionmentioning

confidence: 99%

Quantitative characterization of aberrations in x-ray optics

et al. 2016

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Due to the weak interaction of X-rays with matter and their small wavelength on the atomic scale, stringent requirements are put on X-ray optics manufacturing and metrology. As a result, these optics often suffer from aberrations. Until now, X-ray optics were mainly characterized by their focal spot size and efficiency. However, both measures provide only insufficient information about optics quality. Here, we present a quantitative analysis of residual aberrations in current beryllium compound refractive lenses using ptychography followed by a determination of the wavefront error and subsequent Zernike polynomial decomposition. Known from visible light optics, we show that these measures can provide an adequate tool to determine and compare the quality of various X-ray optics.

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Hard x-ray nanofocusing with refractive x-ray optics: full beam characterization by ptychographic imaging

Cited by 12 publications

References 35 publications

Correcting lateral chromatic aberrations in non-monochromatic X-ray microscopy

Correcting lateral chromatic aberrations in non-monochromatic X-ray microscopy

Hard X-ray nanofocusing at low-emittance synchrotron radiation sources

Quantitative characterization of aberrations in x-ray optics

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