Quantitative characterization of aberrations in x-ray optics

Seiboth, Frank; Kahnt, Maik; Scholz, Maria Brígida dos Santos; Seyrich, Martin; Wittwer, Felix; Garrevoet, Jan; Falkenberg, Gerald; Schropp, Andreas; Schroer, Christian G.

doi:10.1117/12.2237646

Cited by 8 publications

(3 citation statements)

References 23 publications

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“…We propagated Ψ back to the lens exit to obtain Ψ exit ( x , y ). To reveal phase errors, we subtracted the phase of a spherical wave with radius Δ z = z f − z exit that was matched to the distance from lens exit z exit to focal plane z f of the Be CRL 34 :…”

Section: Methodsmentioning

confidence: 99%

Perfect X-ray focusing via fitting corrective glasses to aberrated optics

et al. 2017

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Due to their short wavelength, X-rays can in principle be focused down to a few nanometres and below. At the same time, it is this short wavelength that puts stringent requirements on X-ray optics and their metrology. Both are limited by today's technology. In this work, we present accurate at wavelength measurements of residual aberrations of a refractive X-ray lens using ptychography to manufacture a corrective phase plate. Together with the fitted phase plate the optics shows diffraction-limited performance, generating a nearly Gaussian beam profile with a Strehl ratio above 0.8. This scheme can be applied to any other focusing optics, thus solving the X-ray optical problem at synchrotron radiation sources and X-ray free-electron lasers.

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Section: Methodsmentioning

confidence: 99%

Perfect X-ray focusing via fitting corrective glasses to aberrated optics

et al. 2017

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“…One must next examine restrictions on the optics' shape errors. The Marchal criterion [98], is often used to assess the quality of an optical system. It states that an adequate optical system must possess SR ≥ 0.8, e.g.…”

Section: X-ray Opticsmentioning

confidence: 99%

Towards an ultra-compact x-ray free-electron laser (Conference Presentation)

Rosenzweig

2019

Advances in Laboratory-Based X-Ray Sources, Optics, and Applications VII

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In the field of beam physics, two frontier topics have taken center stage due to their potential to enable new approaches to discovery in a wide swath of science. These areas are: advanced, high gradient acceleration techniques, and xray free electron lasers (XFELs). Further, there is intense interest in the marriage of these two fields, with the goal of producing a very compact XFEL. In this context, recent advances in high gradient radio-frequency cryogenic copper structure research have opened the door to the use of surface electric fields between 250 and 500 MV/m. Such an approach is foreseen to enable a new generation of photoinjectors with sixdimensional beam brightness beyond the current state-of-the-art by well over an order of magnitude. This advance is an essential ingredient enabling an ultra-compact XFEL (UC-XFEL). In addition, one may accelerate these bright beams to GeV scale in less arXiv:2003.06083v1 [physics.acc-ph]An Ultra-Compact X-Ray Free-Electron Laser 2 than 10 meters. Such an injector, when combined with inverse free electron laserbased bunching techniques can produce multi-kA beams with unprecedented beam quality, quantified by 50 nm-rad normalized emittances. These beams, when injected into innovative, short-period (1-10 mm) undulators uniquely enable UC-XFELs having footprints consistent with university-scale laboratories. We describe the architecture and predicted performance of this novel light source, which promises photon production per pulse of a few percent of existing XFEL sources. We review implementation issues including collective beam effects, compact x-ray optics systems, and other relevant technical challenges. To illustrate the potential of such a light source to fundamentally change the current paradigm of XFELs with their limited access, we examine possible applications in biology, chemistry, materials, atomic physics, industry, and medicine which may profit from this new model of performing XFEL science.

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“…4) the first 37 Zernike polynomials were fitted to the retrieved wavefields. 36 The resulting amplitudes z If the center of the diffraction pattern is not exactly in the center of a single pixel, a slight tilt is introduced into the reconstructed wavefield to compensate for the off-centered optical axis. When introducing the phase plate into the optical system the tilt error changed, getting more pronounced for DLS and LCLS, represented by Figs.…”

Section: Aberration-corrected Beryllium Lensesmentioning

confidence: 99%

Aberration correction for hard x-ray focusing at the nanoscale

Seiboth

Schropp

Scholz

et al. 2017

Advances in X-Ray/Euv Optics and Components XII

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We developed a corrective phase plate that enables the correction of residual aberration in reflective, diffractive, and refractive X-ray optics. The principle is demonstrated on a stack of beryllium compound refractive lenses with a numerical aperture of 0.49 × 10 −3 at three different synchrotron radiation and x-ray free-electron laser facilities. By introducing this phase plate into the beam path, we were able to correct the spherical aberration of the optical system and improve the Strehl ratio of the optics from 0.29(7) to 0.87(5), creating a diffraction-limited, large aperture, nanofocusing optics that is radiation resistant and very compact.

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Quantitative characterization of aberrations in x-ray optics

Cited by 8 publications

References 23 publications

Perfect X-ray focusing via fitting corrective glasses to aberrated optics

Perfect X-ray focusing via fitting corrective glasses to aberrated optics

Towards an ultra-compact x-ray free-electron laser (Conference Presentation)

Aberration correction for hard x-ray focusing at the nanoscale

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