“…Because of such issues, different approaches have been taken to implement GaN-based piezoelectric transducers. The solutions that are sought so far include: (a) sputtering metal on the backside of the resonators, which requires release of the structure from the backside using deep reactive ion etching (DRIE) of the substrate [ 1 , 2 , 3 , 4 ]—DRIE is costly and usually not desired; (b) relying on lateral actuation without any bottom electrode—lateral excitation is not efficient as it relies on the weaker piezoelectric coefficient (d 31 ) or the weaker lateral electric field, and yields lower electromechanical coupling; (c) using a two-dimensional electron gas (2DEG) as the bottom electrode [ 5 , 6 , 7 , 8 , 9 ] that is unique to III-V hetero-structures—the 2DEG is generally 20–30 nm below the surface of the structure due to restriction of lattice-mismatched epitaxial growth, considerably limiting the thickness of the active piezoelectric layer compared to the resonant stack and making it inefficient as the actuator. This work seeks a different solution using embedded bottom electrodes for piezoelectric actuation of GaN resonators.…”